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Image Simulation

  • David B. Williams
  • C. Barry Carter

Abstract

When we need to obtain information about the specimen in two directions, we need to align the specimen close to a low-index zone axis. If theHRTEMimage information is going to be directly interpretable, the specimen must be oriented with the incident beam exactly aligned with both the optic axis of the TEM and the zone axis of the specimen. Thus, we will have many reflections excited and the simple two-beam analysis of Chapter 27 cannot be used.

Keywords

HRTEM Image Image Simulation Bloch Wave High Resolution Electron Microscopy Fringe Spacing 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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General

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Scattering Factors

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Quasicrystals

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Models

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Image Simulation

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Some Physics

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Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.The University of Alabama in HuntsvilleHuntsvilleUSA
  2. 2.University of ConnecticutStorrsUSA

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