Elastic Scattering


Elastically scattered electrons are the major source of contrast in TEM images. They also create much of the intensity in DPs, so we need to understand what controls this process. First we’ll consider elastic scattering from single, isolated atoms and then from many atoms together in the specimen. To comprehend elastic scattering we need to invoke both particle and wave characteristics of electrons.


Elastic Scattering Scatter Cross Section Electron Cloud Atomic Plane Diffract Beam 
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Diffraction and Scattering

  1. Andrews, KW, Dyson, DJ and Keown, SR 1967 Electron Diffraction Patterns The Institute of Physics Bristol UK. The original text focused on diffraction in the TEM.Google Scholar
  2. Bragg, WH and Bragg, WL 1913 The Reflection of X-rays by Crystals Proc. Roy. Soc. Lond. A88 428–438. The paper that led to the Nobel Prize.Google Scholar
  3. Doyle, PA and Turner, PS 1968 Relativistic Hartree-Fock X-ray and Electron Scattering Factors Acta Crystallogr. A24 390–397.Google Scholar
  4. Mott, NF and Massey, HSW 1965 The Theory of Atomic Collisions Oxford University Press New York.Google Scholar
  5. Reimer, L 1997 Transmission Electron Microscopy; Physics of Image Formation and Microanalysis 4th Ed. Springer New York. Rigorous thorough treatment of the scattering process, especially as used in Section 3.8.Google Scholar
  6. Rutherford, E 1911 The Scattering of α and β Particles by Matter and the Structure of the Atom Phil. Mag. 21 669–688. His scattering.Google Scholar
  7. von Laue, M 1913 Kritische Bemerkungen zu den Deutungen der Photoframme von Friedrich und KnippingPhys. Z. 14 421–423. Paper that led to the Nobel Prize.Google Scholar
  8. Wang, ZL 1995 Elastic and Inelastic Scattering in Electron Diffraction and Imaging Plenum Press New York. Much more detailed than the approach used here.Google Scholar

Scattering Applied to Em

  1. Hall, CE 1953 Introduction to Electron Microscopy p 229 McGraw-Hill New York.Google Scholar
  2. Jones, IP 1992. Chemical Microanalysis Using Electron Beams Institute of Materials London.Google Scholar
  3. Newbury, DE 1986 Electron Beam-Specimen Interactions in the Analytical Electron Microscope in Principles of Analytical Electron Microscopy p 1 Eds. DC Joy, AD Romig Jr and JI Goldstein Plenum Press New York.Google Scholar
  4. Varela, M, Lupini, AR, van Benthem, K, Borisevich, AY, Chisholm, MF, Shibata, N, Abe, E and Pennycook, SJ 2005 Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope Annu. Rev. Mat. Sci. 35 539–569. Review of Z-contrast imaging.Google Scholar

Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.The University of Alabama in HuntsvilleHuntsvilleUSA
  2. 2.University of ConnecticutStorrsUSA

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