Abstract
In the preceding chapter, we described how to obtain a variety of CBED patterns under various experimental conditions. In this chapter you will find out why these patterns are so useful: they contain a wealth of quantitative data, much of which you can’t obtain by any other technique and many of which augment standard X-ray crystallographic methods (but always at higher spatial resolution). The established techniques largely depend on simple observation of the patterns whereas newer techniques involve quantitative simulations of the patterns.
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The JEOL CBED Atlas
By Tanaka, M et al, 1985-2002 Convergent Beam Electron Diffraction I-IV JEOL Tokyo. The details are in Chapter 20.
Technique
Eades, JA 1989 (Ed.) Journal of Electron Microscopy Techniques 13 (I & II). Special issues on CBED with many useful papers covering much of the content of this chapter.
Jones DN 2007 Sensitive Detection of Mirror Symmetry by CBED Applied to LaAlO3 and GdAlO3 Acta Cryst. B63 69–74. Using off-axis CBED patterns.
Mansfield, JF 1984 Convergent Beam Electron Diffraction of Alloy Phases Adam Hilger Ltd. Bristol UK. A great collection of CBED patterns and proof that steel can still be beautiful.
Morniroli, J-P 2002 Large-Angle Convergent-Beam Electron Diffraction (LACBED) SFμ. (Société Française des Microcopies) Paris, France. The essential instructional text full of great diagrams and practical examples along with an excellent bibliography
Spence, JCH and Zuo, JM 1992 Convergent Beam Electron Diffraction Plenum Press New York. You will want a copy of this book if you use CBED extensively. You may find a reference to earlier CBED studies on your material here in the selective bibliography organized by material. Although now considered obsolete by some, the original code for plotting HOLZ lines is included in the appendices along with the Fortran code for one Bloch wave and one multislice program.
Thickness Determination
Allen, SM 1981 Foil Thickness Measurements from Convergent-Beam Diffraction Patterns Phil. Mag. A43 325–335.
Kelly, PM, Jostons, A, Blake, RG and Napier, JG 1975 The Determination of Foil Thickness by Scanning Transmission Electron Microscopy Phys. Stat Sol. A31 771–780.
Applications
Ayer, R 1989 Determination of Unit Cell J. Electron Microsc. Tech. 13 16–26.
Berta, Y, Ma, C and Wang, ZL 2002 Measuring the Aspect Ratios of ZnO Nanobelts Micron 33 687–691.
Cowley, JM 2001 Electron Nanodiffraction Methods for Measuring Medium-Range Order Ultramicrosc. 90 197–206. Nanodiffraction.
Kim, M, Zuo, JM and Park, G-S 2004 High-Resolution Strain Measurement in Shallow Trench Isolation Structures Using Dynamic Electron Diffraction App. Phys. Lett. 84 2181–2183.
Mansfield, JF 1985 Error Bars in CBED Symmetry? Ultramicrosc. 18 91–96. As it says.
Raghavan, M, Scanlon, JC and Steeds, JW 1984 Use of Reciprocal Lattice Layer Spacing in Convergent Beam Electron Diffraction Analysis Metall. Trans. 15A 1299–1302.
Randle, V, Barker, I and Ralph, B 1989 Measurement of Lattice Parameter and Strain Using Convergent Beam Electron Diffraction J. Electron Microsc. Tech. 13 51–65. Accuracy in using HOLZ lines for determining lattice parameters.
Steeds, JW 1979 Convergent Beam Electron Diffraction in Introduction to Analytical Electron Microscopy 387–422 Eds. JJ Hren, JI Goldstein and DC Joy Plenum Press, New York.
Crystallography
Eades, JA, Moore, S, Pfullman, T and Hangas, J 1993 Discrepancies in Kinematic Calculations of HOLZ Lines Microscopy Research and Technique 24 509–513. The importance of dynamical scattering for HOLZ line calculations.
Inui, H, Fujii, A, Sakamoto, H, Fujio, S and Tanaka, K 2007 Enantiomorph Identification of Crystals Belonging to the Point Groups 321 and 312 by Convergent-Beam Electron Diffraction J. Appl. Cryst. 40 241–249.
Jackson, AG 1987 Prediction of HOLZ Pattern Shifts in Convergent Beam Diffraction J. Electron Microsc. Tech. 5 373–377. Collected data.
Jackson, AG 1990, Identification of the Laue Zone Number in HCP Systems in Convergent Beam Electron Diffraction Ultramicrosc. 32 181–182.
Nye, JF 1985 Physical Properties of Crystals (2nd Ed.) Oxford University Press New York.
Indexing and Lattice Parameters
Ecob, RC, Shaw, MP, Porter, AJ and Ralph, B 1981 Application of Convergent-Beam Electron Diffraction to the Detection of Small Symmetry Changes Accompanying Phase Transformations – I. General and Methods Phil. Mag. A44 1117–1133. Early HOLZ/FOLZ.
Fournier, D, L'Esperance, G, Saint-Jacques, RG 1989 Systematic Procedure for Indexing HOLZ Lines in Convergent Beam Electron Diffraction Patterns of Cubic Crystal J. Electr. Microsc. Tech. 13 123–149.
Morawiec, A 2007 A Program for Refinement of Lattice Parameters Based on Multiple Convergent-Beam Electron Diffraction Patterns J. Appl. Cryst. 40 618–622.
Rozeveld, SJ and Howe, JM 1993 Determination of Multiple Lattice Parameters from Convergent-Beam Electron Diffraction Patterns Ultramicrosc. 50 41–56.
Bonds
Spackman, MA, Jiang, B, Groy, TL, He, H, Whitten, AE and Spence, JCH 2005 Phase Measurement for Accurate Mapping of Chemical Bonds in Acentric Space Groups Phys. Rev. Lett. 95 085502–05. Inversion symmetry.
Zuo, JM, Kim, M, O’Keeffe, M and Spence, JCH 1999 Direct Observation of d-Orbital Holes and Cu-Cu Bonding in Cu2O Nature 401 49–52. ‘Imaging’ atomic orbitals
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Williams, D.B., Carter, C.B. (2009). Using Convergent-Beam Techniques. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-76501-3_21
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