Abstract
The core strength ofTEMis that you can obtain both a DP and an image from the same part of your specimen (not to mention various spectra). To obtain the crystallographic data, a method for interpreting and indexing the DP is essential and this aspect is the theme for the next four chapters. We’ll start in this chapter by considering classic selected-area diffraction (SAD) patterns (SADPs) and how to index them, but also introduce other related, if less widely used, parallel-beam diffraction methods.
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References
We list more references than usual in this chapter. You'll want to see many different examples so go to the originals where possible.
Crystallography and Diffraction
Andrews, KW, Dyson, DJ and Keown, SR 1971 Interpretation of Electron Diffraction Patterns 2nd Ed. Plenum Press New York. An essential resource for anyone using electron diffraction.
Burger, MJ 1978 Elementary Crystallography MIT Press Cambridge Massachusetts. One of the classics. Find it in the library.
Champness, PE 2001 Electron Diffraction in the TEM Bios (RMS) Oxford UK. Superb, concise introductory text; full of great examples.
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Edington, JW 1976 Practical Electron Microscopy in Materials Science Van Nostrand-Reinhold New York. Part 2 of the book is full of useful hints and examples on analyzing DPs.
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Glazer, AM 1987 The Structure of Crystals Adam Hilger Bristol United Kingdom. The essentials condensed into a 50-page monograph. Find it in the library
Hammond, C 1992 Introduction to Crystallography 2nd Ed. Royal Microscopical Society Oxford United Kingdom. An excellent compact introduction to the subject with a nice section on the biographies of crystallographers.
Johari, O and Thomas, G 1969 The Stereographic Projection and Its Applications in Techniques of Metals Research Ed. RF Bunshah Interscience New York. A very helpful book if you can find a copy in your library (it's out of print).
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Amorphous Materials
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Diffraction Techniques
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Vincent, R and Midgley, PA 1994 Double Conical Beam-Rocking System for Measurement of Integrated Electron Diffraction Intensities Ultramicroscopy 53 271–282. Precession diffraction.
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Williams, D.B., Carter, C.B. (2009). Obtaining and Indexing Parallel-Beam Diffraction Patterns. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-76501-3_18
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