Nano and Giga Challenges for Information Technology

  • R. Stanley Williams
Part of the Nanostructure Science and Technology book series (NST)


Functional Scaling Logic Circuit Entire Circuit Device Death Reliable Machine 
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Copyright information

© Springer Science+Business Media, LLC 2008

Authors and Affiliations

  • R. Stanley Williams
    • 1
  1. 1.Information and Quantum Systems LaboratoryHP Labs, Hewlett-Packard CompanyMS 1123, Palo Alto

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