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Hybrid Scan-Based Transition Delay Test

Launch-off-shift (LOS) method provides higher fault coverage and lower pattern count when compared to launch-off-capture (LOC) method. Investigations have proven that some faults can be detected using LOC but not LOS and vice-versa. In LOS, the second pattern (i.e. pattern V 2) is generated using the last shift while in LOC method, the second pattern is the functional response of the first pattern (i.e. pattern V 1). To take advantage of both methods' ability in detecting different faults, the patterns generated using one method are applied on top of the other method's pattern set. This method, in industry, is often called LOS+LOC. It provides a fault coverage higher than that of LOS but the design effort still remains high since the scan enable to all scan chains must be timing closed because of using LOS method.

Keywords

Test Pattern Transition Fault Fault Coverage Delay Fault Pattern Count 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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