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In launch-off-capture method, the at-speed constraint on the scan enable signal is relaxed (low-cost tester compliant) and the transition is launched from the functional path. The controllability of launching a transition at a target gate is less when compared to launch-off-shift method, as it depends on the functional response of the circuit under test to the initialization vector. In addition, the low-cost tester interface requirements such as no primary input changes and primary outputs being masked during launch to capture cycle impact the LOC coverage. It has become a common practice to include primary inputs and primary outputs in scan chain during scan insertion. This allows test engineers to test transition delay faults for the paths between primary inputs and internal flip-flops. Similarly, the paths between internal flip-flops and primary outputs are tested as well. However, the paths between chip pins and the cell wrapper inserted on primary inputs and primary outputs cannot be tested using low-cost testers.

Keywords

Transition Fault Fault Coverage Shift Operation Delay Fault Circuit Under Test 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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