Probabilistic amp; Statistical Design—the Wave of the Future

  • Shekhar Borkar
Conference paper
Part of the IFIP International Federation for Information Processing book series (IFIPAICT, volume 249)

As technology scales, variability will continue to become worse. Random dopant fluctuations, sub-wavelength lithography, and dynamic variations due to circuit behavior will look like inherent unreliability in the design. Increasing soft errors will increase intermittent error rate by almost two orders of magnitude. As transistors scale even further, degradation due to aging will become worse. We discuss these effects and propose solutions in microarchitecture, design, and testing, for designing with billions of unreliable components to yield predictable and reliable systems, with probabilistic and statistical design methodology.


Critical Path Dopant Atom Very Large Scale Integration Soft Error Leakage Power 
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Copyright information

© International Federation for Information Processin 2008

Authors and Affiliations

  • Shekhar Borkar
    • 1
  1. 1.Intel CorpHillsboroUSA

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