Physical Approach to Reliability
Gain in-depth understanding of the basic physical failure mechanisms for given semiconductor device structure and process
Maintain understanding of phenomena that are limiting safe operation regimes and long-term reliability parameters
Develop recommendations for device design using knowledge of failure mechanisms toward possible reduction, compensation, or even elimination of particular failure mechanisms while preserving the basic operation parameters within desired spec limits
Reveal potentially “weak” places in the device architecture, process technology, and manufacturing for identified failure mechanisms
Provide competent, physically reasonable choice of the test regimes and long-term reliability tests
Understand the limitations of diagnostic methods according to the basic failure mechanisms
Estimate real transistor reliability in physically reasonable regimes of safe operating area (SOA)
Estimate the long-term reliability parameters with the help of accelerated tests focusing on the indications of potential reliability issues.
KeywordsReliability Parameter Bipolar Transistor Accelerate Test Physical Approach Operation Regime
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