Abstract
The electrically operated phase-change random access memory (PRAM) features faster write/read, improved endurance, and much simpler fabrication as compared with the traditional transistor-based nonvolatile semiconductor memories. Low-dimensional phase-change materials in nanoscale dimensions offer advantages over their bulk or thin-film counterparts in several aspects such as reduced programmable volume and reduced thermal energies in phase transition. These features contribute to low-power operation, excellent scalability, and fast write/erase time. In this chapter, we present a general bottom-up synthesis approach and systematic material analysis study of one-dimensional chalcogenide-based phase-change materials including germanium telluride (GeTe), and indium selenide (In2Se3) nanowires that are targeted for nonvolatile resistive switching data storage. The phase-change nanowires have been synthesized via thermal evaporation method under vaporliquid—solid (VLS) mechanism. The morphology, composition, and crystal structure of the synthesized nanowires were investigated by scanning electron microscopy, energy dispersive X-ray spectroscopy, and high-resolution transmission electron microscopy. The as-synthesized nanowires are structurally uniform with single crystalline structures. The one-dimensional phase-change chalcogenide nanowires exhibit significantly reduced melting points, low activation energy, and excellent morphology, making them promising nanomaterials for data storage devices with very low energy consumption and excellent scalability.
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Sun, X., Yu, B., Ng, G., Meyyappan, M. (2008). One-Dimensional Phase-Change Nanomaterials for Information Storage Applications. In: Wang, Z.M. (eds) One-Dimensional Nanostructures. Lecture Notes in Nanoscale Science and Technology, vol 3. Springer, New York, NY. https://doi.org/10.1007/978-0-387-74132-1_11
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DOI: https://doi.org/10.1007/978-0-387-74132-1_11
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