A Methodology for Reliability Enhancement of Nanometer-Scale Digital Systems Based on a-priori Functional Fault- Tolerance Analysis

  • Milos Stanisavljevic
  • Alexandre Schmid
  • Yusuf Leblebici
Part of the IFIP International Federation for Information Proc book series (IFIPAICT, volume 240)

This paper presents a new approach for monitoring and estimating device reliability of nanometer-scale devices prior to fabrication. A four-layer architecture exhibiting a large immunity to permanent as well as random failures is used. A complete tool for a-priori functional fault tolerance analysis was developed. It is a statistical Monte Carlo based tool that induces different failure models, and does subsequent evaluation of system reliability under realistic constraints. A structured fault modeling architecture is also proposed, which is together with the tool a part of the new design method where reliability is considered as a central focus from an early development stage.


Monte Carlo Correct Operation Device Failure Triple Modular Redundancy Redundancy Factor 
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Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  • Milos Stanisavljevic
    • 1
  • Alexandre Schmid
    • 1
  • Yusuf Leblebici
    • 1
  1. 1.Microelectronic Systems Laboratory (LSM)Swiss Federal Institute of Technology EPFLSwitzerland

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