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A Methodology for Reliability Enhancement of Nanometer-Scale Digital Systems Based on a-priori Functional Fault- Tolerance Analysis

  • Milos Stanisavljevic
  • Alexandre Schmid
  • Yusuf Leblebici
Part of the IFIP International Federation for Information Proc book series (IFIPAICT, volume 240)

This paper presents a new approach for monitoring and estimating device reliability of nanometer-scale devices prior to fabrication. A four-layer architecture exhibiting a large immunity to permanent as well as random failures is used. A complete tool for a-priori functional fault tolerance analysis was developed. It is a statistical Monte Carlo based tool that induces different failure models, and does subsequent evaluation of system reliability under realistic constraints. A structured fault modeling architecture is also proposed, which is together with the tool a part of the new design method where reliability is considered as a central focus from an early development stage.

Keywords

Monte Carlo Correct Operation Device Failure Triple Modular Redundancy Redundancy Factor 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  • Milos Stanisavljevic
    • 1
  • Alexandre Schmid
    • 1
  • Yusuf Leblebici
    • 1
  1. 1.Microelectronic Systems Laboratory (LSM)Swiss Federal Institute of Technology EPFLSwitzerland

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