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Direct Writing Techniques: Electron Beam and Focused Ion Beam

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Electrochemistry at the Nanoscale

Part of the book series: Nanostructure Science and Technology ((NST))

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Abstract

Due to significant theoretical and technological new advances, nanostructuring of surfaces has attracted a great deal of scientific interest. The continuous demand for shrinking the dimensions of structures to reach the nanometer scale is mainly motivated by the discovery of new behaviors dominated by unique properties that are encountered when nanosize dimensions are approached (e.g., quantum confinement). Additionally, a major thrust for shrinking dimensions originates from the microelectronic field requiring the development of smaller devices, system integration, and system diversification. Thus, electronic materials as well as integrated materials adding new features must be structured at the micro- and nanometer scale.

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References

  1. Takumi, U. Sheats, J.R. 1998, X-ray Lithography, J. R. Sheats and B. W. Smith (Ed.), Marcel Dekker, Inc., New York, 403–427.

    Google Scholar 

  2. Madou, M. 1997, Fundamentals of microfabrication, CRC Press, Boca Raton.

    Google Scholar 

  3. Stockman, L., Heyvaert, I., van Haesendonck, C., and Bruynseraede, Y. 1993, Appl. Phys. Lett., 62, 2935.

    CAS  Google Scholar 

  4. Matsumoto, K., Ishii, M., Segawa, K., Oka, Y., Vartanian, B.J., and Harris, J.S. 1996, Appl. Phys. Lett., 68, 34.

    CAS  Google Scholar 

  5. Campbell, P.M., Snow, E.S., and McMarr, P.J. 1995, Appl. Phys. Lett., 66, 1388.

    CAS  Google Scholar 

  6. Xia, Y. Whitesides, M.W. 1998, Angew. Chem. Int. Ed., 37, 550.

    CAS  Google Scholar 

  7. Schmuki, P., Maupai, S., Djenizian, T., Santinacci, L., Spiegel, A., and Schlierf, U. 2004, Techniques in Electrochemical Nanotechnology, H. S. Nalwa (Ed.), American Scientific Publishers, Stevenson Ranch, 393–410.

    Google Scholar 

  8. Schuster, R., Kirchner, V., Allongue, P., and Ertl, G. 2000, Science, 289, 98.

    CAS  Google Scholar 

  9. Allongue, P., Jiang, P., Kirchner, V., Trimmer, A.L., and Schuster, R. 2004, J. Phys. Chem. B, 108, 14434.

    CAS  Google Scholar 

  10. Santinacci, L., Djenizian, T., and Schmuki, P. 2001, Appl. Phys. Lett., 79, 1882.

    CAS  Google Scholar 

  11. Owen, G. Sheats, J.R. 1998, Electron beam lithography systems, J. R. Sheats and B. W. Smith (Ed.), Marcel Dekker, Inc., New York, 367–401.

    Google Scholar 

  12. Stewart, D.K. Casey, J.D.J. 1997, P. Rai-Choudry (Ed.), SPIE Optical Engineering Press, 153.

    Google Scholar 

  13. Townsend, P.D., Chandler, P.J., and Zhang, L. 1994, Optical effects of ion implantation, Cambridge University Press, Cambridge.

    Google Scholar 

  14. Ryssel, H. Ruge, I. 1986, Ion implantation, John Wiley & Sons

    Google Scholar 

  15. Hartley, N.E.W. 1980, Treatise of Materials Science and Tehnology, Academic Press

    Google Scholar 

  16. Dearnaley, G. 1982, J. Metals, 34, 18.

    Google Scholar 

  17. Straede, C.A. 1989, Wear, 130, 113.

    Google Scholar 

  18. Standley, R.D., Gibson, W.M., and Rodgers, J.W. 1972, Appl. Optics, 11, 1313.

    CAS  Google Scholar 

  19. Heidenreich, R.D. 1964, Fundamentals of Transmission Electron Microscopy, Interscience, New York.

    Google Scholar 

  20. Sigmund, P. 1972, Roumaine Phys., 17, 823.

    CAS  Google Scholar 

  21. Weller, R. 1995, Handbook of Modern ion-Beam Materilas Analysis, J. R. Tessmer & M. Nastasi (Ed.), Materials Research Society, Pittsburg, PA.

    Google Scholar 

  22. Nastasi, M.A., Mayer, J.W., and Hirvonen, J.K. 1996, Ion-Solid Interactions, Cambridge University Press.

    Google Scholar 

  23. Rutherford, E. 1911, Phil. Mag., 21, 669.

    CAS  Google Scholar 

  24. Reimer, L. Pfefferkorn, G. 1977, Rasterelektronenmikroskopie, Springer-Verlag Berlin Heidelberg, New York.

    Google Scholar 

  25. Werner, U. Johansen, H. 1982, Elektronenmikroskopie in der Festkörperphysik, Springer-Verlag Berlin Heidelberg New York

    Google Scholar 

  26. Williams, D.B. Carter, C.B. 1996, Transmission Electron Microscopy I, Plenum Press, New York.

    Google Scholar 

  27. Lindhard, J. Scharff, H. 1961, Phys. Rev., 124, 128.

    CAS  Google Scholar 

  28. Fermi, E. 1928, Z. Phys., 48, 73.

    CAS  Google Scholar 

  29. Thomas, L.H. 1927, Proc. Cambr. Phil. Soc., 23, 524.

    Google Scholar 

  30. Ziegler, J.F., Biersack, J.P., and Littmark, U. 1985, The Stopping and Range of Ions in Solids, Pergamon Press, New York.

    Google Scholar 

  31. Lindhard, J. Winter, A. 1964, Mat. -Fys. Medd., 34, N° 4.

    Google Scholar 

  32. Bethe, H. 1930, Ann. Phys., 5, 325.

    CAS  Google Scholar 

  33. Bethe, H. 1932, Z. Phys., 76, 293.

    CAS  Google Scholar 

  34. Chu, W.K. Powers, D. 1972, Phys. Lett., 40A, 23.

    Google Scholar 

  35. Kramers, M.A. 1923, Phil. Mag., 46, 836.

    CAS  Google Scholar 

  36. Hobbs, L.W. 1979, Introduction to Analytical Electron Microscopy, J. I. Goldstein & D. C. Joy J. J. Hren (Ed.), Plenum Press New York, 437.

    Google Scholar 

  37. Kinchin, G.H. Pease, R.S. 1955, Rep. Prog. Phys., 18, 1.

    Google Scholar 

  38. Sigmund, P. 1969, Phys. Rev., 184, 383.

    CAS  Google Scholar 

  39. Matsunami, N., Yamamura, Y., Itikawa, Y., Itoh, N., Kazumata, Y., Miyagawa, S., Morita, K., Shimizu, R., and Tawara, H. 1984, At. Data Nucl. Data Tables, 31, 1.

    CAS  Google Scholar 

  40. Smith, K.C.A. Oatley, C.W. 1955, Br. J. Appl. Phys., 6, 391.

    Google Scholar 

  41. Buck, D.A. Shoulders, K. 1957, in Proceedings Eastern Joint Computer Conference, ATEE, New York, 55.

    Google Scholar 

  42. Broers, A.N. 1965, Microelectron. Reliab., 4, 103.

    Google Scholar 

  43. Craighead, H.G., Howard, R.E., Jackel, L.D., and Mankiewich, P.M. 1983, Appl. Phys. Lett., 42, 38.

    CAS  Google Scholar 

  44. Sedgwick, T.O., Broers, A.N., and Agule, B.J. 1972, J. Electrochem. Soc., 119, 1769.

    CAS  Google Scholar 

  45. Broers, A.N., Molzen, W.W., Cuomo, J.J., and Wittels, N.D. 1976, Appl. Phys. Lett., 29, 596.

    CAS  Google Scholar 

  46. Rakhshandehroo, M.R. Pang, S.W. 1996, J. Vac. Sci. Technol. B, 14, 612.

    CAS  Google Scholar 

  47. Sung, K.T. Pang, S.W. 1992, J. Vac. Sci. Technol. B, 10, 2211.

    CAS  Google Scholar 

  48. Simon, G., Haghiri Gosnet, A.M., Carcenac, F., and Launois, H. 1997, Microelectron. Eng., 35, 51.

    CAS  Google Scholar 

  49. Allee, D.R., Umbach, C.P., and Broers, A.N. 1991, J. Vac. Sci. Technol. B, 9, 2838.

    CAS  Google Scholar 

  50. Matsui, S., Ichihashi, T., and Mito, M. 1989, J. Vac. Sci. Technol. B, 7, 1182.

    CAS  Google Scholar 

  51. Allee, D.R. Broers, A. 1990, Appl. Phys. Lett., 57, 2271.

    Google Scholar 

  52. Pan, X., Allee, D.R., Broers, A., Tang, Y.S., and Wilkinson, C.W. 1991, Appl. Phys. Lett., 59, 3157.

    CAS  Google Scholar 

  53. Jackel, L.D., Howard, R.E., Mankiewich, P.M., Craighead, H.G., and Epworth, W. 1984, Appl. Phys. Lett., 45, 698.

    CAS  Google Scholar 

  54. Schmoranzer, H. 1988, J. Vac. Sci. Technol. B, 6, 2053.

    CAS  Google Scholar 

  55. Parikh, M. Kyser, D.F. 1979, J. Appl. Phys., 50, 1004.

    Google Scholar 

  56. Chang, T.H.P. 1975, J. Vac. Sci. Technol., 12, 1271.

    Google Scholar 

  57. Haller, I., Hatzakis, M., and Srinivassan, R. 1968, IBM J. Res. Dev., 251.

    Google Scholar 

  58. Thomson, L.F., Stillwagon, L.E., and Doerries, E.M. 1978, J. Vac. Sci. Technol., 15, 938.

    Google Scholar 

  59. Dobisz, E.A., Marrian, C.R.K., and Colton, R.J. 1991, J. Appl. Phys., 70, 1793.

    CAS  Google Scholar 

  60. Gölzhäuser, A., Geyer, W., Stadler, V., Eck, W., Grunze, M., Edinger, K., Weimann, T., and Hinze, P. 2000, J. Vac. Sci. Technol. B, 18, 3414.

    Google Scholar 

  61. Lercel, M.J., Craighead, H.G., Parikh, A.N., Seshadri, K., and Allara, D.L. 1996, Appl. Phys. Lett., 68, 1504.

    CAS  Google Scholar 

  62. Fujita, J., Watanabe, H., Ochiai, Y., Manako, S., Tsai, J.S., and Matsui, S. 1995, J. Vac. Sci. Technol. B, 13, 2757.

    CAS  Google Scholar 

  63. Muray, A., Scheinfein, M., Isaacson, M., and Adesida, I. 1985, J. Vac. Sci. Technol. B, 3, 367.

    CAS  Google Scholar 

  64. Thackeray, J.W., Orsula, G.W., Canistro, D., and Berry, A.K. 1989, J. Photopolymer Sci. Technol., 2, 429.

    CAS  Google Scholar 

  65. Scherer, A. Craighead, H.G. 1987, J. Vac. Sci. Technol. B, 5, 374.

    CAS  Google Scholar 

  66. Broers, A.N. 1988, IBM J. Res. Dev., 32, 502.

    CAS  Google Scholar 

  67. Eigler, D.M. Schweizer, E.I. 1991, Nature, 344, 524.

    Google Scholar 

  68. Umbach, C.P., Washburn, S., Laibowitz, R.B., and Webb, R.A. 1984, Phys. Rev. B, 30, 4048.

    CAS  Google Scholar 

  69. Xu, W., Wong, J., Cheng, C.C., Johnson, R., and Scherer, A. 1995, J. Vac. Sci. Technol. B, 13, 2372.

    CAS  Google Scholar 

  70. Chen, Y.L., Chen, C.C., Jeng, J.C., and Chen, Y.F. 2004, Appl. Phys. Lett., 85, 1259.

    CAS  Google Scholar 

  71. Dubois, S., Duvail, J.L., and Piraux, L. 2000, Actual. Chimique, 4, 42.

    Google Scholar 

  72. Li, A.P., Müller, F., and Gösele, U. 2000, Electrochem. and Solid-State Lett., 3, 131.

    CAS  Google Scholar 

  73. Borini, S., Amato, G., Rocchia, M., Boarino, L., and Rossi, A.M. 2003, J. Appl. Phys., 93, 4439.

    CAS  Google Scholar 

  74. Borini, S. 2005, J. Electrochem. Soc., 152, G482.

    CAS  Google Scholar 

  75. Ulman, R. 1996, Chem. Rev., 96, 1533.

    CAS  Google Scholar 

  76. Ulman, A. 1991, An Introduction to Ultrathin Organic Films From Langmuir-Blodgett to Self-Assembly, Academic press, Inc., San Diego.

    Google Scholar 

  77. Effenberger, F., Goetz, G., Bidlingmaier, B., and Wezstein, M. 1998, Angew. Chem., 110/18, 2651.

    Google Scholar 

  78. Effenberger, F., Goetz, G., Bidlingmaier, B., and Wezstein, M. 1998, Angew. Chem. Int. Ed., 37, 2462.

    CAS  Google Scholar 

  79. Linford, M.R. Chidsey, C.E.D. 1993, J. Am. Chem. Soc., 115, 12631.

    CAS  Google Scholar 

  80. Boukherroub, R., Morin, S., Sharpe, P., Wayner, D.D.M., and Allongue, P. 2000, Langmuir, 16, 7429.

    CAS  Google Scholar 

  81. White, H.S., Kittlesen, G.P., and Wrighton, M.S. 1984, J. Am. Chem. Soc., 106, 5375.

    CAS  Google Scholar 

  82. Chidsey, C.E.D. 1991, Science, 251, 219.

    Google Scholar 

  83. Frisbie, C.D., Fritsch-Faules, I., Wollman, E.W., and Wrighton, M.S. 2002, Thin-Solid-Films, 210, 341.

    Google Scholar 

  84. Chaki, N.K. Vijayamohanan, K. 2002, Biosens. Bioelectron., 17, 1.

    CAS  Google Scholar 

  85. Dulcey, C.S., Georger, J.H., Krauthamer, V., Stenger, D.A., Fare, T.L., and Calver, M.J. 1991, Science, 252, 551.

    CAS  Google Scholar 

  86. Perkins, M.K., Dobisz, E.A., Brandow, S.L., Calvert, J.M., Kosakowski, J.E., and Marrian, C.R.K. 1996, Appl. Phys. Lett., 68, 550.

    CAS  Google Scholar 

  87. Ada, E.T., Hanley, L., Etchin, S., Melngailis, J., Dressick, W.J., Chen, M.S., and Calvert, J.M. 1995, J. Vac. Sci. Technol. B, 13, 2189.

    CAS  Google Scholar 

  88. Lercel, M.J., Whelan, C.S., Craighead, H.G., Seshadri, K., and Allara, D.L. J. Vac. Sci. Technol. B, 14, 4085.

    Google Scholar 

  89. Sondag Huethorst, J.A.M., van Helleputte, H.R.J., and Fokkink, L.G.J. 1994, Appl. Phys. Lett., 64, 285.

    CAS  Google Scholar 

  90. Koops, H.W.P., Schössler, C., Kaya, A., and Weber, M. 1996, J. Vac. Sci. Technol. B, 14, 4105.

    CAS  Google Scholar 

  91. Fritzsche, W., Kohler, J.M., Bohm, K.J., Unger, E., Wagner, T., Kirsch, R., Mertig, M., and Pompe, W. 1999, Nanotechnology, 10, 331.

    Google Scholar 

  92. Kohlmann von Platen, K.T., Thiemann, M., and Brünger, W.H. 1991, Microelectron. Eng., 13, 279.

    Google Scholar 

  93. Koops, H.W.P. 1996, T. C. Hale and K. L. Telschow (Ed.), Proceedings of SPIE Volume, 248.

    Google Scholar 

  94. Koops, H.W.P., Munro, E., Rouse, J., Kretz, J., Rudolph, M., Weber, M., and Dahm, G. 1995, Nucl. Instrum. Methods Phys. Res. B, 363, 1.

    CAS  Google Scholar 

  95. Weber, M., Rudolph, M., Kretz, J., and Koops, H.W.P. 1995, J. Vac. Sci. Technol. B, 13, 461.

    CAS  Google Scholar 

  96. Schoessler, C. Koops, H.W.P. 1998, J. Vac. Sci. Technol. B, 16, 862.

    CAS  Google Scholar 

  97. Koops, H.W.P., Kretz, J., Rudolph, M., and Weber, M. 1993, J. Vac. Sci. Technol. B, 11, 2386.

    CAS  Google Scholar 

  98. Voss, R.F., Laibowitz, R.B., and Broers, A.N. 1980, Appl. Phys. Lett., 37, 656.

    CAS  Google Scholar 

  99. Komuro, M. Hiroshima, H. 1997, Microelectron. Eng., 35, 273.

    CAS  Google Scholar 

  100. Matsui, S. Mori, K. 1986, J. Vac. Sci. Technol. B, 4, 299.

    Google Scholar 

  101. Utke, I., Luisier, A., Hoffmann, P., Laub, D., and Buffat, P.A. 2002, Appl. Phys. Lett., 81, 3245.

    CAS  Google Scholar 

  102. Hübner, U., Plontke, R., Blume, M., Reinhardt, A., and Koops, H.W.P. 2001, Microelectron. Eng., 57, 953.

    Google Scholar 

  103. Christy, R.W. 1960, J. Appl. Phys., 31, 1680.

    CAS  Google Scholar 

  104. Koops, H., Weiel, R., Kern, D.P., and Baum, T.H. 1988, J. Vac. Sci. Technol. B, 6, 477.

    CAS  Google Scholar 

  105. Scheuer, V., Koops, H., and Tschudi, T. 1986, Microelectron. Eng., 5, 423.

    CAS  Google Scholar 

  106. Hoyle, P.C., Ogasawara, M., and Cleaver, J.R.A. 1993, Appl. Phys. Lett., 62, 3043.

    CAS  Google Scholar 

  107. Reimer, L. 1997, Transmission Electron Microscopy, Springer-Verlag, Berlin.

    Google Scholar 

  108. Lee, K.L. Hatzakis, M. 1989, J. Vac. Sci. Technol. B, 7, 941.

    Google Scholar 

  109. Hoyle, P.C., Cleaver, J.R.A., and Ahmed, H. 1994, Appl. Phys. Lett., 64, 1448.

    CAS  Google Scholar 

  110. Kuntz, R.R. Mayer, T.M. 1986, J. Vac. Sci. Technol. B, 5, 427.

    Google Scholar 

  111. Miura, N., Ishii, H., Shirakashi, J., Yamada, A., and Konagai, M. 1997, Appl. Surf. Sci., 113/114, 269.

    Google Scholar 

  112. Miura, N., Numaguchi, T., Yamada, A., Konagai, M., and Shirakashi, J.I. 1997, Jpn. J. Appl. Phys., 36, 1619.

    Google Scholar 

  113. Miura, N., Ishii, H., Yamada, A., and Konagi, M. 1996, Jpn. J. Appl. Phys., 35, L1089.

    CAS  Google Scholar 

  114. Amman, M., Sleight, J.W., Lombardi, D.R., Welser, R.E., Deshpande, M.R., Reed, M.A., and Guido, L.J. 1996, J. Vac. Sci. Technol. B, 14, 54.

    CAS  Google Scholar 

  115. Guise, O., Ahner, J., Yates Jr, J.T., and Levy, J. 2004, Appl. Phys. Lett., 85, 2352.

    CAS  Google Scholar 

  116. Zeng, Z.M., Tian, X.B., Kwok, T.K., Tang, B.Y., Fung, M.K., and Chu, O.K. 2000, J. Vac. Sci. Technol. A, 18, 2164.

    CAS  Google Scholar 

  117. Zhang, S., Zeng, X.T., Xie, H., and Hing, P. 2000, Surf. Coat. Technol., 123, 256.

    CAS  Google Scholar 

  118. Broers, A.N. 1964, in Proceedings of the First International Conference on Electron and Ion Beam Technology, Wiley, New York, 181.

    Google Scholar 

  119. Molzen, W.W., Broers, A.N., Cuomo, J.J., Harper, J.M.E., and Laibowitz, R.B. 1979, J. Vac. Sci. Technol., 16, 269.

    CAS  Google Scholar 

  120. Ueta, A., Avramescu, A., Uesugi, K., Suemune, I., Machida, H., and Shimoyama, N. 1998, Jpn. J. Appl. Phys., 37, 272.

    Google Scholar 

  121. Djenizian, T., Santinacci, L., and Schmuki, P. 2001, Appl. Phys. Lett., 78, 2840.

    Google Scholar 

  122. Miura, N., Yamada, A., and Konagai, M. 1997, Jpn. J. Appl. Phys., 36, L1275.

    Google Scholar 

  123. Sieber, I., Hildebrand, H., Djenizian, T., and Schmuki, P. 2003, Electrochem. and Solid-State Lett., 6, C1.

    CAS  Google Scholar 

  124. Djenizian, T., Macak, J., and Schmuki, P. 2002, in Nano- and Micro-Electromechanical Systems (NEMS and MEMS) and Molecular Machines, Mat. Res. Soc. Symp. Proc., Boston, 79–83.

    Google Scholar 

  125. Djenizian, T., Santinacci, L., and Schmuki, P. 2001, J. Electrochem. Soc., 148, 197.

    Google Scholar 

  126. Scharifker, B. Hills, G. 1983, Electrochim. Acta, 28, 879.

    CAS  Google Scholar 

  127. Scharifker, B. Mostany, J. 1984, J. Electroanal. Chem., 177, 13.

    CAS  Google Scholar 

  128. Gunawardena, G., Hills, G., Montenegro, I., and Scharifker, B. 1982, J. Electroanal. Chem., 138, 225.

    CAS  Google Scholar 

  129. Scherb, G. Kolb, D.M. 1995, J. Electroanal. Chem., 396, 151.

    Google Scholar 

  130. Vereecken, P.M., Strubbe, K., and Gomes, W.P. 1997, J. Electroanal. Chem., 433, 19.

    CAS  Google Scholar 

  131. Stiger, R.M., Gorer, S., Craft, B., and Penner, R.M. 1999, Langmuir, 15, 790.

    CAS  Google Scholar 

  132. Oskam, G., van Heerden, D., and Searson, P.C. 1998, Appl. Phys. Lett., 73, 3241.

    CAS  Google Scholar 

  133. Pasa, A.A. Schwarzacher, W. 1999, Phys. Status Solidi A, 173, 73.

    CAS  Google Scholar 

  134. Rashkova, B., Guel, B., Pötzschke, R.T., Staikov, G., and Lorenz, W.J. 1998, Electrochim. Acta, 43, 3021.

    CAS  Google Scholar 

  135. Djenizian, T., Santinacci, L., and Schmuki, P. 2004, J. Electrochem. Soc., 151, G175-G180.

    CAS  Google Scholar 

  136. Djenizian, T., Santinacci, L., Hildebrand, H., and Schmuki, P. 2003, Surf. Sci., 524, 40.

    CAS  Google Scholar 

  137. Stewart, D.K., Doyle, A.F., and Casey, J.D.J. 1995, SPIE, 2437, 276.

    CAS  Google Scholar 

  138. Xu, X. Melngailis, J. 1993, J. Vac. Sci. Technol. B, 11, 2436.

    CAS  Google Scholar 

  139. Frey, L. Lehrer, C. 2003, Praktische Metallographie, 40, 184.

    CAS  Google Scholar 

  140. Hooghan, K.N., Wills, K.S., Rodriguez, P.A., and O'Connell, S. 1999, in ASM International, Materials Park, Ohio, 247.

    Google Scholar 

  141. Van Doorselaer, K., Van den Reeck, M., Van Den Bempt, L., Young, R., and Whitney, J. 1993, in Proc. 19th International Symposium for Testing and Failure Analysis, ASM International, Materials Park, Ohio, 405.

    Google Scholar 

  142. Verkleij, D. 1998, Microelectron. Reliab., 38, 869.

    Google Scholar 

  143. Nikawa, K. 1994, IEICE Trans. Fund. Electr., E77, 174.

    Google Scholar 

  144. Hahn, L.L., Abramo, M.T., and Coutu, P.T. 1991, in Proc. 17th International Symposium for Testing and Failure Analysis, ASM International, Materials Park, Ohio, 1.

    Google Scholar 

  145. Walker, J.F., Reiner, J.C., and Solenthaler, C. 1995, Inst. Phys. Conf. Ser., 146, 629.

    CAS  Google Scholar 

  146. Ishitani, T. Yaguchi, T. 1996, Microsc. Res. Techn., 35, 320.

    CAS  Google Scholar 

  147. Rai, R., Subramanian, S., Rose, S., Conner, J., Schani, P., and Moss, J. 2000, in Proc. 26th International Symposium for Testing and Failure Analysis, 415.

    Google Scholar 

  148. Stevie, F.A., Irwin, R.B., Shofner, T.L., Brown, S.R., Drown, J.L., and Giannuzzi, L.A. 1998, in, American Institute of Physics, Woodburry, NY, 868.

    Google Scholar 

  149. Vasile, M.J., Xie, J., and Nassar, R. 1999, J. Vac. Sci. Technol. B, 17, 3085.

    CAS  Google Scholar 

  150. Ishitani, T., Ohnishi, T., Madokoro, Y., and Kawanami, Y. 1991, J. Vac. Sci. Technol. B, 9, 2633.

    CAS  Google Scholar 

  151. Vasile, M.J., Grigg, D., Griffith, J.E., Fitzgerald, E., and Russel, P.E. 1991, J. Vac. Sci. Technol. B, 9, 3569.

    Google Scholar 

  152. Olbrich, A., Ebersberger, B., Boit, C., Niedermann, P., Hänni, W., Vancea, J., and Hoffmann, H. 1999, J. Vac. Sci. Technol. B, 17, 1570.

    CAS  Google Scholar 

  153. Hill, A.R. 1968, Nature, 218, 292.

    Google Scholar 

  154. Guharay, S.K., E., S., and Orloff, J. 1999, J. Vac. Sci. Technol. B, 17, 2779.

    CAS  Google Scholar 

  155. Orloff, J. Swanson, L.W. 1975, J. Vac. Sci. Technol. B, 12, 1209.

    CAS  Google Scholar 

  156. Kohn, V.E. Ring, G.R. 1975, Appl. Phys. Lett., 27, 479.

    Google Scholar 

  157. Orloff, J. 1993, Rev. Sci. Instrum., 64, 1105.

    CAS  Google Scholar 

  158. Frey, L. Lehrer, C. 2003, Applied Physics A, 76, 1017.

    CAS  Google Scholar 

  159. Wang, K., Chelnokov, A., Rowson, S., Garoche, P., and Lourtioz, J.M. 2000, J. Phys. D: Appl. Phys., 33, L119.

    CAS  Google Scholar 

  160. Gruning, U., Lehmann, V., Ottow, S., and Bush, K. 1996, Appl. Phys. Lett., 68, 747.

    Google Scholar 

  161. Schmidt, B., Bischoff, L., and Teichert, J. 1997, Sens. Actuators A, 61, 369.

    Google Scholar 

  162. Brugger, J., Beljakovic, G., Despont, M., de Rooiji, N.F., and Vettiger, P. 1997, Microelectron. Eng., 35, 401.

    CAS  Google Scholar 

  163. Chen, W., Chen, P., Madhukar, R., Viswanathan, R., and So, J. 1993, Mater. Res. Soc. Proc., 279, 599.

    CAS  Google Scholar 

  164. Cummings, K.D., Harriott, L.R., Chi, G.C., and Ostermayer, F.W. 1986, Proc. SPIE Int. Soc. Opt. Eng., 93.

    Google Scholar 

  165. Arimoto, H., Kosugi, M., Kitada, H., and Miyauchi, E. 1989, Microelectron. Eng., 9, 321.

    CAS  Google Scholar 

  166. Rennon, S., Bach, L., König, H., Reithmaier, J.P., Forchel, A., Gentner, J.L., and Goldstein, L. 2001, 57–58, 891.

    Google Scholar 

  167. D'Arrigo, G. Spinella, C. 2001, Mater. Sci. Semicond. Proc., 4, 93.

    Google Scholar 

  168. Spinella, C. 1998, Mater. Sci. Semicond. Proc., 1, 55.

    CAS  Google Scholar 

  169. Garozzo, G., La Magna, A., Coffa, S., D'Arrigo, G., Parasole, N., Renna, M., and Spinella, C. 2002, Comp. Mater. Sci., 24, 246.

    CAS  Google Scholar 

  170. Schmuki, P., Erickson, L.E., and Lockwood, D.J. 1998, Phys. Rev. Lett., 80, 4060.

    CAS  Google Scholar 

  171. Schmuki, P. Erickson, L.E. 2000, Phys. Rev. Lett., 85, 2985.

    CAS  Google Scholar 

  172. Spiegel, A., Erickson, L.E., and Schmuki, P. 2000, J. Electrochem. Soc., 147, 2993.

    CAS  Google Scholar 

  173. Spiegel, A., Staemmler, L., Dobeli, M., and Schmuki, P. 2002, J. Electrochem. Soc., 149, C432.

    CAS  Google Scholar 

  174. Berger, M.J. and Seltzer, S.M. 1964, NASA-SP-3012.

    Google Scholar 

  175. Fitting, H.J. 1974, Phys. Stat. Sol. A, 26, 525.

    CAS  Google Scholar 

  176. Gibbons, J.F., Johnson, W.S., and Mylroie, S.W. 1975, Projected Range Statistics, Stroudsburg.

    Google Scholar 

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Djenizian, T., Lehrer, C. (2009). Direct Writing Techniques: Electron Beam and Focused Ion Beam. In: Schmuki, P., Virtanen, S. (eds) Electrochemistry at the Nanoscale. Nanostructure Science and Technology. Springer, New York, NY. https://doi.org/10.1007/978-0-387-73582-5_4

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