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Corrosion at the Nanoscale

  • Vincent Maurice
  • Philippe Marcus
Chapter
Part of the Nanostructure Science and Technology book series (NST)

Abstract

In a variety of new technologies, materials with nanoscale architecture or thin functional layers on their surfaces are being used and will be developed in the near future. Like all materials, these new materials can be used only if they are stable against environmental degradation (corrosion). However, the loss of material due to corrosion which is accepted for conventional materials (i.e., mm/year) is no longer acceptable and must be controlled and limited to values less than 10–100 nm. The concept of corrosion at the nanoscale is not restricted to metallic materials in the classic sense, but applies to all products incorporating small-size metallic parts (e.g., contacts, interconnects, displays, implants, and sensors), and ultrathin layers conferring the relevant property (or function) to the material surface. To obtain good stability, protective films of nanometer thickness can be used, but the protective effect must not be obtained at the expense of other surface functionalities. To increase the durability of the protection, self-repair of the ultrathin protective films is a key factor.

Keywords

Atomic Force Microscopy Scanning Tunneling Microscopy Passive Film Auger Electron Spectroscopy Duplex Stainless Steel 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

References

  1. 1.
    D.W. Suggs, A.J. Bard, J. Am. Chem. Soc. 116: 10725, 1994.CrossRefGoogle Scholar
  2. 2.
    D.W. Suggs, A.J. Bard, J. Phys. Chem. 99: 8349, 1995.CrossRefGoogle Scholar
  3. 3.
    T.P. Moffat, Mat. Res. Soc. Symp. Proc. 451: 75, 1997.Google Scholar
  4. 4.
    M.R. Vogt, A. Lachenwitzer, O.M. Magnussen, R.J. Behm, Surf. Sci. 399: 49, 1998.CrossRefGoogle Scholar
  5. 5.
    O.M. Magnussen, M.R. Vogt, J. Scherer, R.J. Behm, Appl. Phys. A 66: S447, 1998.Google Scholar
  6. 6.
    P. Broekmann, M. Anastasescu, A. Spaenig, W. Lisowski, K. Wandelt, J. Electroanal. Chem. 500: 241, 2001.CrossRefGoogle Scholar
  7. 7.
    O.M. Magnussen, L. Zitzler, B. Gleich, M.R. Vogt, R.J. Behm, Electrochim. Acta 46: 3725, 2001.CrossRefGoogle Scholar
  8. 8.
    T. Suzuki, T. Yamada, K. Itaya, J. Phys. Chem. 100: 8954, 1996.CrossRefGoogle Scholar
  9. 9.
    M. Dietterle, T. Will, D.M. Kolb, Surf. Sci. 327: L495, 1995.CrossRefGoogle Scholar
  10. 10.
    S. Ando, T. Suzuki, K. Itaya, J. Electroanal. Chem. 431: 277, 1997.CrossRefGoogle Scholar
  11. 11.
    S. Ando, T. Suzuki, K. Itaya, J. Electroanal. Chem. 412: 139, 1996.CrossRefGoogle Scholar
  12. 12.
    T. Teshima, K. Ogaki, K. Itaya, J. Phys. Chem. B 101: 2046, 1997.Google Scholar
  13. 13.
    K. Sashikata, Y. Matsui, K. Itaya, M.P. Soriaga, J. Phys. Chem. 100: 20027, 1996.CrossRefGoogle Scholar
  14. 14.
    K. Itaya, in Interfacial Electrochemistry – Theory, Experiments and Applications, A. Wieckowski, Editor, p. 187, Marcel Dekker, New York, 1999.Google Scholar
  15. 15.
    M.R. Vogt, W. Polewska, O.M. Magnussen, R.J. Behm, J. Electrochem. Soc. 144: L113, 1997.CrossRefGoogle Scholar
  16. 16.
    M.R. Vogt, R.J. Nichols, O.M. Magnussen, R.J. Behm, J. Phys. Chem. B 102: 5859, 1998.Google Scholar
  17. 17.
    M. Sugimasa, L.-J. Wan, J. Inukai, K. Itaya, J. Electrochem. Soc. 149: E367, 2002.CrossRefGoogle Scholar
  18. 18.
    W. Polewska, M.R. Vogt, O.M. Magnussen, R.J. Behm, J. Phys. Chem. B 103: 10440, 1999.Google Scholar
  19. 19.
    J. Scherer, M.R. Vogt, O.M. Magnussen, R.J. Behm, Langmuir 13: 7045, 1997.CrossRefGoogle Scholar
  20. 20.
    C.W. Yan, H.C. Lin, C.N. Cao, Electrochim. Acta 45: 2815, 2000.CrossRefGoogle Scholar
  21. 21.
    E. Rocca, G. Bertrand, C. Rapin, J.C. Labrune, J. Electroanal. Chem. 503: 103, 2001.Google Scholar
  22. 22.
    N. Ikemiya, T. Kubo, S. Hara, Surf. Sci. 323: 81, 1995.CrossRefGoogle Scholar
  23. 23.
    V. Maurice, H.-H. Strehblow, P. Marcus, Surf. Sci. 458: 185, 2000.CrossRefGoogle Scholar
  24. 24.
    J. Kunze, V. Maurice, L.H. Klein, H.-H. Strehblow, P. Marcus, J. Phys. Chem. B, 105: 4263, 2001.CrossRefGoogle Scholar
  25. 25.
    J. Kunze, V. Maurice, L.H. Klein, H.-H. Strehblow, P. Marcus, Electrochim. Acta 48: 1157, 2003.Google Scholar
  26. 26.
    J. Kunze, V. Maurice, L.H. Klein, H.-H. Strehblow, P. Marcus, J. Electroanal. Chem. 554–555, 113–125, 2003.Google Scholar
  27. 27.
    J. Kunze, V. Maurice, L.H. Klein, H.-H. Strehblow, P. Marcus, Corrosion Sci. 46: 245–264, 2004.CrossRefGoogle Scholar
  28. 28.
    G.S. Frankel, J. Electrochem. Soc. 145: 2186, 1998.CrossRefGoogle Scholar
  29. 29.
    P. Marcus, V. Maurice, Passivity of metals and alloys in Corrosion and Environmental Degradation, M. Schütze, (Ed.), (Wiley-VCH, Weinheim, 2000), pp. 131–169.Google Scholar
  30. 30.
    J.W. Schultze, M.M. Lohrengel, Electrochim. Acta 45: 2499, 2000.CrossRefGoogle Scholar
  31. 31.
    P. Marcus (Ed.), Corrosion Mechanisms in Theory and Practice, 2nd edition (Marcel Dekker Inc., New York, 2002).Google Scholar
  32. 32.
    O. Lev, F.-R. Fan, A. J. Bard, J. Electrochem. Soc. 135: 783, 1988.CrossRefGoogle Scholar
  33. 33.
    V. Maurice, H. Talah, P. Marcus, Surf. Sci. 284: L431, 1993.CrossRefGoogle Scholar
  34. 34.
    V. Maurice, H. Talah, P. Marcus, Surf. Sci. 304: 98, 1994.CrossRefGoogle Scholar
  35. 35.
    S.-L. Yau, F.-R. Fan, T. P. Moffat. A. J. Bard, J. Phys. Chem. 98: 5493, 1994.CrossRefGoogle Scholar
  36. 36.
    D. Zuili, V. Maurice, P. Marcus, J. Electrochem. Soc. 147: 1393, 2000.CrossRefGoogle Scholar
  37. 37.
    N. Hirai, H. Okada, S. Hara, Transaction JIM 44: 727, 2003.CrossRefGoogle Scholar
  38. 38.
    J. Scherer, B.M. Ocko, O.M. Magnussen, Electrochim. Acta 48: 1169, 2003.Google Scholar
  39. 39.
    M. Nakamura, N. Ikemiya, A. Iwasaki, Y. Suzuki, M. Ito, J. Electroanal. Chem. 566: 385–391, 2004.CrossRefGoogle Scholar
  40. 40.
    A. Seyeux, V. Maurice, L.H. Klein, P. Marcus, J. Solid State Electrochem. 9: 337–346, 2005.CrossRefGoogle Scholar
  41. 41.
    R.C. Bhardwaj, A. Gonzalez-Martin, J.O'M. Bockris, J. Electroanal. Chem. 307: 195, 1991.CrossRefGoogle Scholar
  42. 42.
    M.P. Ryan, R.C. Newman, G.E. Thompson, J. Electrochem. Soc. 142: L177, 1995.CrossRefGoogle Scholar
  43. 43.
    J. Li, D.J. Meier, J. Electroanal. Chem. 454: 53, 1998.CrossRefGoogle Scholar
  44. 44.
    I. Diez-Pérez, P. Gorostiza, F. Sanz, C. Müller, J. Electrochem. Soc. 148: B307, 2001.CrossRefGoogle Scholar
  45. 45.
    E.E. Rees, M.P. Ryan, D.S. MacPhail, Electrochem. Solid-State Lett. 5: B21, 2002.CrossRefGoogle Scholar
  46. 46.
    V. Maurice, W. Yang, P. Marcus, J. Electrochem. Soc. 141: 3016, 1994.CrossRefGoogle Scholar
  47. 47.
    D. Zuili, V. Maurice, P. Marcus, J. Phys. Chem. B 103: 7896, 1999.CrossRefGoogle Scholar
  48. 48.
    R.C. Bhardwaj, A. Gonzalez-Martin, J.O'M. Bockris, J. Electrochem. Soc. 138: 1901, 1991.CrossRefGoogle Scholar
  49. 49.
    A. Foelske, J. Kunze, H.-H. Strehblow, Surf. Sci. 554: 10–24, 2004.CrossRefGoogle Scholar
  50. 50.
    M.P. Ryan, R.C. Newman, G.E. Thompson, Philosophical Mag. B 70: 241, 1994.CrossRefGoogle Scholar
  51. 51.
    M.P. Ryan, R.C. Newman, G.E. Thompson, J. Electrochem. Soc. 141: L164, 1994.CrossRefGoogle Scholar
  52. 52.
    V. Maurice, W. Yang, P. Marcus, J. Electrochem. Soc. 143: 1182, 1996.CrossRefGoogle Scholar
  53. 53.
    H. Nanjo, R.C. Newman, N. Sanada, Appl. Surf. Sci. 121: 253, 1997.CrossRefGoogle Scholar
  54. 54.
    V. Maurice, W. Yang, P. Marcus, J. Electrochem. Soc. 145: 909, 1998.CrossRefGoogle Scholar
  55. 55.
    J. Oudar, P. Marcus, Appl. Surf. Sci. 3: 48, 1979.Google Scholar
  56. 56.
    O.M. Magnussen, J. Scherer, B. M. Ocko, R. J. Behm, J. Phys. Chem. B 104: 1222, 2000.Google Scholar
  57. 57.
    P. Marcus, V. Maurice, Passivity and Its Breakdown, Joint ECS/ISE meeting, Paris, France, 1997, P. Natishan, H.S. Isaacs, M. Janik-Czachor, V.A. Macagno, P. Marcus, M. Seo, (Eds.), The Electrochemical Society Proceedings Series, PV 97-26, Pennington, NJ, 1998, pp. 254–265.Google Scholar
  58. 58.
    V. Maurice, V. Inard, P. Marcus, Critical Factors in Localized Corrosion III, P.M. Natishan, R.G. Kelly, G.S. Frankel, R.C. Newman (Eds.), The Electrochemical Society Proceedings Series, PV 98-17, Pennington, NJ, 1999, pp. 552–562.Google Scholar
  59. 59.
    V. Maurice, L. Klein, P. Marcus, Electrochem. Solid-State Lett. 4: B1, 2001.CrossRefGoogle Scholar
  60. 60.
    V. Maurice, L. Klein, P. Marcus, Surf. Interf. Anal. 34: 139, 2002.CrossRefGoogle Scholar
  61. 61.
    V. Maurice, T. Nakamura, L. Klein, P. Marcus, Proceedings of Eurocorr’2004, EFC Series, in press.Google Scholar
  62. 62.
    R.M. Rynders, C.-H. Paik, R. Ke, R.C. Alkire, J. Electrochem. Soc. 141: 1439, 1994.CrossRefGoogle Scholar
  63. 63.
    J.O. Park, C.-H. Paik, Y.H. Huang, R.C. Alkire, J. Electrochem. Soc. 146, 517, 1999.CrossRefGoogle Scholar
  64. 64.
    G. Gugler, J.D. Neuvecelle, P. Mettraux, E. Rosset, D. Landolt, Modifications of Passive Films, P. Marcus, B. Baroux, M. Keddam, (Eds.), EFC publications n°12, The Institute of Materials, p. 274, 1994.Google Scholar
  65. 65.
    D.E. Williams, T.F. Mohiuddin, Y.Y. Zhu, J. Electrochem. Soc. 145: 2664, 1998.CrossRefGoogle Scholar
  66. 66.
    R.E. Williford, C.F. Windisch Jr., R.H. Jones, Mat. Sci. Engin. A288: 54–60, 2000.CrossRefGoogle Scholar
  67. 67.
    B. Vuillemin, X. Philippe; R. Oltra, V. Vignal, L. Coudreuse, L.C. Dufour, E. Finot, Corros. Sci. 45: 1143–1159, 2003.CrossRefGoogle Scholar
  68. 68.
    M.P. Ryan, D.E. Williams, R.J. Chater, B.M. Hutton, D.S. McPhail, Nature 415: 770–774, 2002.CrossRefGoogle Scholar
  69. 69.
    Q. Meng, G.S. Frankel, H.O. Colijn, S.H. Goss, Nature 424: 389–390, 2004.CrossRefGoogle Scholar
  70. 70.
    M. Femenia, J. Pan, C. Leygraf, P. Luukkonen, Corrosion Sci. 43: 1939, 2001.CrossRefGoogle Scholar
  71. 71.
    Z.-X. Xie, D.M. Kolb, J. Electroanal. Chem. 481: 177, 2000.CrossRefGoogle Scholar
  72. 72.
    S.G. Garcia, D.R. Salinas, C.E. Mayer, W.J. Lorenz, G. Staikov, Electrochim. Acta, 48: 1279–1285, 2003.CrossRefGoogle Scholar
  73. 73.
    B. Obliers, M. Anastasescu, P. Broeckmann, K. Wandelt, Surf. Sci. 573: 47–56, 2004.CrossRefGoogle Scholar
  74. 74.
    L. Chen, D. Guay, J. Electrochem. Soc. 141: L43, 1994.CrossRefGoogle Scholar
  75. 75.
    L. Roue, L. Chen, D. Guay. Langmuir 12: 5818, 1996.CrossRefGoogle Scholar
  76. 76.
    P. Schmutz, G.S. Frankel, J. Electrochem. Soc. 145: 2295, 1998.CrossRefGoogle Scholar
  77. 77.
    P. Schmutz, G.S. Frankel, J. Electrochem. Soc. 146: 4461, 1999.CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.Laboratoire de Physico-Chimie des Surfaces, CNRS-ENSCP (UMR 7045)Ecole Nationale Supérieure de Chimie de Paris, Université Pierre et Marie CurieParis Cedex 05France
  2. 2.Laboratoire de Physico-Chimie des Surfaces, CNRS-ENSCP (UMR 7045)Ecole Nationale Supérieure de Chimie de Paris, Université Pierre et Marie CurieParisFrance

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