Abstract
ICs accommodate millions of transistors in a single device. Therefore it is a necessity to identify faults in the design process at the time when they are implemented. Faults already may have been introduced in the process of specification, in the implementation into digital logic, or even in the models used for simulation of the circuit.
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Prochaska, E. (2003). Digital Simulation. In: Jansen, D. (eds) The Electronic Design Automation Handbook. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-73543-6_11
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DOI: https://doi.org/10.1007/978-0-387-73543-6_11
Publisher Name: Springer, Boston, MA
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