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Biological Low-Voltage Scanning Electron Microscopy pp 129–144Cite as

Noise and Its Effects on the Low-Voltage SEM

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References

  • Baiker JA (1960) IEEE Trans. Nucl. Sci. 7:74

    Article  Google Scholar 

  • Bright et al. (1998) J. of Microscopy, 189: 25

    Google Scholar 

  • Erasmus SJ, Holburn DM, Smith KCA (1980) Instr. Phys. Conf. Ser. 52, p73–76

    Google Scholar 

  • Everhart TE (1970) Cambridge Stereoscan Colloquium. Engis Corp; Chicago, 2:1–6

    Google Scholar 

  • Filippov YA (1966) Soviet Physics-Solid State, 8:701–705

    Google Scholar 

  • Frank J, El Ali L (1975) Nature 256, 376–379

    Article  PubMed  CAS  Google Scholar 

  • Goldstein J, Newbury DE, Joy DC, Lyman C, Echlin P, Lifshin E, Sawyer L, and Michael J (2003), Scanning Electron Microscopy and X-ray Microanalysis, 3 rd Edition, Kluewer Academic/Plenum Publishers 689

    Google Scholar 

  • Herrman K-H (1983) in “Quantitative Electron Microscopy”, Proc. 25th Scottish Universities Summer School in Physics, (Scottish Universities Summer School: Aberdeen, UK), ed, J N Chapman and A J Craven, 119

    Google Scholar 

  • Joy DC (2002) J. of Microscopy 208:4–34

    Article  Google Scholar 

  • Joy DC and Bunn RD (1989) Proceeding 47th Annual Meeting EMSA, ed, G W Bailey. San Francisco Press: San Francisco, 47:84–85

    Google Scholar 

  • Joy DC, Joy CS, and Bunn RD (1996) Scanning 18:181–186

    Google Scholar 

  • Morton GA and Mitchel JA (1948) RCA Review 9:632,

    Google Scholar 

  • Oho E, Asai N, Itoh S (2000) J. Electron Microscopy 49:761–763

    CAS  Google Scholar 

  • Pawley J (1974) Scanning Electron Microscopy/1974, Proc. 7th Annual SEM Symposium. ed. O Johari, IITRI: Chicago, 27–34

    Google Scholar 

  • Rose A (1948) Advan. Electron. Electron Physics 1:131

    Google Scholar 

  • Seiler H (1983) Secondary Electrons in the SEM, J. App. Phys., 54:R1

    Article  CAS  Google Scholar 

  • Shannon C (1948) Bell Telephone System Tech. Publ. Monograph B-1598

    Google Scholar 

  • Simon R (1970) J. Appl. Physics, 41:4632

    Article  Google Scholar 

  • Thong THL, Sim KS, Phang JCH (2001) Scanning 23:328–336

    Article  PubMed  CAS  Google Scholar 

  • Yamada S, Ito T, Gouhara K, Uchikawa Y (1991) Scanning, 13:165–171

    Google Scholar 

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Authors
  1. David C. Joy
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Editor information

Editors and Affiliations

  1. Department of Veterinary Pathobiology, University of Missouri-Columbia, 1600 E. Rollins Street, Columbia, MO 65211, USA

    Heide Schatten

  2. Department of Zoology, University of Wisconsin, 250 N. Mills Street, Madison, WI 53706, USA

    James B. Pawley

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Joy, D.C. (2008). Noise and Its Effects on the Low-Voltage SEM. In: Schatten, H., Pawley, J.B. (eds) Biological Low-Voltage Scanning Electron Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-72972-5_4

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