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Notes
- 1.
A log2 transformation was used for voltages so as to represent a twofold change by a difference of one on the log2 scale. A log10 transformation was used for concentrations to simplify interpretation of the graphs. The linearity of the response is, of course, unaffected by the choice of base for the logarithm.
References
B.M. Bolstad, R.A. Irizarry, M. Astrand, and T.P. Speed. A comparison of normalization methods for high density oligonucleotide array data based on bias and variance. Bioinformatics, 19(2):185–193, 2003.
W.S. Cleveland. Robust locally weighted regression and smoothing scatterplots. Journal of the American Statistical Association, 74(368):829–836, 1979.
W.G. Cochran and G.M. Cox. Experimental Designs. John Wiley & Sons, New York, second edition, 1957.
A. Cross, J. Settle, N. Drake, and R. Paivinen. Subpixel measurement of tropical forest cover using avhrr data. International Journal of Remote Sensing, 12:1119–1129, 1991.
T. Hastie, R. Tibshirani, and J. Friedman. The Elements of Statistical Learning: Data Mining, Inference and Prediction. Springer, New York, 1st edition, 2001.
I. Helland. PLS regression and statistical models. Scandinavian Journal of Statistics, 17:97–114, 1990.
P. Huber. Robust Statistics. John Wiley and Sons, New York, 1981.
I. Jolliffe. Principal Components Analysis. Springer Verlag, New York, 1986.
M. Stone. Crossvalidatory choice and assessment of statistical predictions. Journal of the Royal Statistical Society. Series B (Methodological), 36:111–147, 1974.
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Thomas, M. (2009). Intensity Concentration Relationships for Electrochemical Detection. In: Dill, K., Liu, R.H., Grodzinski, P. (eds) Microarrays. Integrated Analytical Systems. Springer, New York, NY. https://doi.org/10.1007/978-0-387-72719-6_5
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