Emerging Techniques in Polymer Microscopy


In the previous edition of this book, this chapter was called “New Techniques in Polymer Microscopy.” Now, nearly 10 years later, many of these once new techniques, like atomic force microscopy (AFM), have become standard for many polymer microscopists. Others, such as confocal scanning microscopy, or scanning near-field optical microscopy, have developed and become much more common, but they are rarely applied to polymeric systems. It is still worthwhile to mention these techniques as they might solve the problems arising in some new areas of polymer science and engineering. Therefore the chapter is now called “Emerging Techniques in Polymer Microscopy” and covers both the truly novel techniques that are emerging rapidly, and those that are not as new but have continued to emerge slowly for decades.


Atomic Force Microscopy Surface Enhance Raman Scattering Scanning Transmission Electron Microscopy Contact Mode Atomic Force Microscopy Color Insert 


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© Linda C. Sawyer, David T. Grubb 2008

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