Abstract
The basic optics of the optical microscope and the conventional transmission electron microscope (TEM) are similar. Condenser lenses illuminate the object to be imaged with a flood of radiation, and imaging lenses form the radiation leaving the object into a magnified image. The formation, contrast and resolution of images in these microscopes can be understood with classical optics, which includes geometrical (particle) and physical (wave) optics. Both electrons and light may be considered as propagating waves with an amplitude and a phase, though only the intensity which equals (amplitude)2 can be directly observed.
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References
F.A. Jenkins and H.E. White, Fundamentals of Optics, 4th ed. (McGraw-Hill, New York, 2001).
E. Hecht, Optics, 4th ed. (Addison Wesley, Reading, MA, 2001).
W.T. Welford, Optics, (Oxford University Press, Oxford, 1988).
L.C. Martin, The Theory of the Microscope (Blackie, London, 1966).
M. Born and E. Wolf, Principles of Optics, 7th ed. (Pergamon, Oxford, 1999).
E.M. Slayter and H.S. Slayter, Light and Electron Microscopy (Cambridge University Press, Cambridge, 1992).
T.G. Rochow and P.A. Tucker, Introduction to Microscopy by Means of Light, Electrons, X-Rays, or Acoustics, 2nd ed. (Springer, New York, 1994).
S.G. Lipson and H. Lipson, Optical Physics (Cambridge University Press, Cambridge, 1969).
M. Spencer, Fundamentals in Light Microscopy (Cambridge University Press, Cambridge, 1982).
L. Reimer, Transmission Electron Microscopy, Physics of Image Formation and Microanalysis, 4th ed. (Springer, Berlin, 1997).
J.R. Waring, R. Lovell, G.R. Mitchell and A.H. Windle, J. Mater. Sci. 17 (1982) 1171.
I.G. Voigt-Martin, Adv. Polym. Sci. 67 (1985) 196.
Z. Zhang and X. Yang, Polymer 47 (2006) 5213.
J. Buerger, Elementary Crystallography (Wiley, New York, 1963).
W. Borchardt-Ott, Crystallography, 2nd ed. (Springer, New York, 1995).
D.E. Sands, Introduction to Crystallography (Dover, New York, 1994) [reprint].
C. Hammond, The Basics of Crystallography and Diffraction (IUCr Oxford University Press, Oxford, 1997).
C. Giacovazzo, Ed. Fundamentals of Crystallography 2nd ed. (Oxford University Press, Oxford, New York, 2002).
N.H. Hartshorne and A. Stuart, Crystals and the Polarizing Microscope (Elsevier, New York, 1970).
P. Gay, An Introduction to Crystal Optics (Longmans, London, 1967).
L.H. Schwartz and J.B. Cohen, Diffraction from Materials (Springer-Verlag, Berlin, 1987).
J.M. Schultz, Diffraction for Materials Scientists (Prentice-Hall, Englewood Cliffs, NJ, 1982).
J.M. Cowley, Ed. Electron Diffraction Techniques (Oxford University Press, Oxford, New York, 1992–1993).
J.C.H. Spence and J.M. Zuo, Electron Microdiffraction (Plenum Press, New York, 1992).
D.B. Williams and C.B. Carter, Transmission Electron Microscopy: A Textbook for Materials Science (Plenum Press, New York, 1996).
B. Wunderlich, Macromolecular Physics, Vol. 1 (Academic Press, New York, 1973).
P. Allen and M. Bevis, Proc. Roy. Soc. A341 (1974) 75.
A.J. Lovinger and H.D. Keith, Macromolecules 12 (1979) 919.
D.L. Dorset, Structural Electron Crystallography (Springer, New York, 1995).
D.L. Dorset, Rep. Prog. Phys. 66 (2003) 305.
A. Du Chesne, Macromol. Chem. Phys. 200 (1999) 1813.
R.H. Geiss, G.B. Street, W. Volksen and J. Economy, IBM J. Res. Develop. 27 (1983) 321.
W. Claffey, K. Gardner, J. Blackwell, J. Lando and P.H. Geil, Philos. Mag. 30 (1974) 1223.
J.R. Fryer and D.L. Dorset, Eds. Electron Crystallography of Organic Molecules (Kluwer Academic Publishers, Dordrecht, Boston, 1991).
L.E. Alexander, X-ray Diffraction Methods in Polymer Science (Wiley-Interscience, New York, 1969).
M. Kakudo and N. Kasai, X-ray Diffraction by Polymers (Elsevier, Amsterdam, 1972).
R.D. Heidenreich, Fundamentals of Transmission Microscopy (Wiley, New York, 1964).
J.I. Goldstein, D.E. Newbury, D.C. Joy, C.E. Lyman, P. Echlin, E. Lifshin, L.C. Sawyer and J.R. Michael, Scanning Electron Microscopy and X-ray Microanalysis, 3rd ed. (Plenum, New York, 2003).
C.E. Hall, Introduction to Electron Microscopy, 2nd ed. (McGraw-Hill, New York, 1966).
P. Buseck, J. Cowley and L. Eyring, Eds. High-Resolution Transmission Electron Microscopy and Associated Techniques (Oxford University Press, Oxford, 1988).
K. Stenn and G.F. Bahr, J. Ultrastruct. Res. 31 (1970) 526.
D.T. Grubb, J. Mater. Sci. 9 (1974) 1715.
L. Reimer, Ed. Energy-Filtering Transmission Electron Microscopy (Springer, New York, 1995).
K.H. Kortje, U. Paulus, M. Ibsch and H. Rahmann, J. Microsc. 183 (1996) 89.
J.C.H. Spence, High-Resolution Tranmission Electron Microscopy, 3rd ed. (Oxford University Press, Oxford, 2003).
D.C. Martin and E.L. Thomas, Polymer 36 (1995) 1743.
D.C. Martin, J. Chen, J. Yang, L.F. Drummy and C. Kuebel, J. Polym. Sci. B. Polym. Phys. 43 (2005) 1749.
S. Kumar and W.W. Adams, Polymer 31 (1990) 15.
W.G. Hartley, Proc. Roy. Microsc. Soc. 9 (1974) 167.
W.A. Shurcliff and S.S. Ballard, Polarized Light (Van Nostrand, New York, 1964).
G.N. Ramachandran and S. Ramaseshan, in Handbuch der Physik, edited by S. Flugge (Springer-Verlag, Berlin, 1961).
C.W. Mason, Handbook of Chemical Microscopy (Wiley, New York, 1983).
D.A. Hemsley, Ed. Applied Polymer Light Microscopy (Elsevier Applied Science, London, New York, 1989).
N.H. Hartshorne and A. Stuart, Practical Optical Crystallography, 2nd ed. (Elsevier, New York, 1969).
F.D. Bloss, Optical Crystallography (Mineral Society of America. 1999).
J.G. Delly, The Michel-Lévy Interference Color Chart—Microscopy’s Magical Color Key. (2003) Available at http://www.modernmicroscopy.com. Accessed October 2006.
M.M. Swann and J.M. Mitchison, J. Exp. Biol. 27 (1950) 226.
N.H. Hartshorne, Sci. Prog. 50 (1962) 11.
L. Reimer and P.W. Hawkes, Scanning Electron Microscopy, Physics of Image Formation and Microanalysis (Springer-Verlag, Berlin, 1998).
L. Reimer, Image Formation in Low-Voltage Scanning Electron Microscopy (SPIE, Bellingham, WA, 1993).
J.H. Butler, D.C. Joy, G.F. Bradley and S.J. Krause, Polymer 36 (1995) 1761.
D.L. Vezie, E.L. Thomas and W.W. Adams, Polymer 36 (1995) 1781.
R. Gauvin, K. Robertson, P. Horny, A.M. Elwazri and S. Yue, JOM 58 (2006) 20.
J.E. Barth and P. Kruit, Optik 101 (1996) 101.
S.K. Chapman, Scanning Microscopy 13 (1999) 141.
H.A. Bethe, Ann. Phys. 5 (1930) 325.
K. Kanaya and S. Okayama, J. Phys. D Appl. Phys. 5 (1972) 43.
K.F.J. Heinrich, in Proc. 4th Intl. Conf. on X-ray Optics and Microanal., edited by R. Castaing, P. Deschamps and J. Philbert (Hermann, Paris, 1966).
K.F.J. Heinrich and D.E. Newbury, Electron Probe Quantitation (Plenum Press, New York, 1991).
D.B. Wittry, in X-ray Optics and Microanalysis, 4th Intl. Cong., edited by R. Castaing, P. Deschamps and J. Philibert (Herman, Paris, 1966).
D.C. Joy, Scanning 11 (1989) 1.
D.C. Joy and C.S. Joy, Microsc. Microanal. 4 (1998) 475.
J.B. Pawley, J. Microsc. 136 (1984) 45.
J.J. Hren, J.I. Goldstein and D.C. Joy, Introduction to Analytical Microscopy (Plenum, New York, 1979).
D. Drouin, CASINO. Available at http://www.gel.usherbrooke.ca/casino/. Accessed July 2006.
D.C. Joy and J.B. Pawley, Ultramicroscopy 47 (1992) 80.
J. Chang, S. Krause and R. Gorur, Proc. XIIth Intl. Congr. Electr. Micr., edited by L.D. Peachey and D.B. Williams (San Francisco Press, Inc., 1990), p. 1108.
C.W. Price and P.L. McCarthy, Scanning 10 (1988) 29.
P.B. Himelfarb and K.B. Labat, Scanning 12 (1990) 148.
B. Volbert and L. Reimer, Scanning Electron Microscopy 4, (1980) 1.
M. Brunner and R. Schmid, Scanning Microsc. 1 (1987) 1501.
L. Reimer and B. Volbert, Scanning 2 (1979) 238.
M.T. Postek, W.J. Keery and N.V. Frederick, Rev. Sci. Instrum. 61 (1990) 1648.
H. Jaksch, M. Steigerwald, V. Drexel and H. Bihr, Microsc. Microanal. 9 (2003) 106.
G.D. Danilatos and R. Postle, Scanning Electron Microsc. Part 1 (1982) 1.
G.D. Danilatos, Adv. Electronics Electron Phys. 71 (1988) 109.
V. Robinson, J. Comp. Assisted Microsc. 5 (1992) 247.
D.J. Stokes, Philos. Trans. Roy. Soc. London A 361 (2003) 2771.
G.D. Danilatos, Microsc. Res. Techn. 25 (1993) 354.
D.E. Newbury, J. Res. Natl. Inst. Stand. Technol. 107 (2002) 567.
R. Durkin and J.S. Shah, J. Microsc. 169 (1993) 33.
B.J. Griffin and C. Nockolds, in Proc. 14th Intl. Conf. on Electron Microscopy, edited by H. Calderon (Institute of Physics, London, 1998), p. 359.
R.A. Rapp, Pure Appl. Chem. 56 (1984) 1715.
K. Ramani, C.J. Hoyle and N.C. Parasnis, ASME Mater. Div. Publ. MD 46 (1993) 633.
D.J. Stokes, Adv. Eng. Mater. 3 (2001) 126.
N. Franz, M.O. Ahlers, A. Abdullah and H. Hohenberg, J. Mater. Sci. 41 (2006) 4561.
S. Mehta, in Proc. SPE Annu. Tech. Conf. Exhib. Pi (Production Operations and Engineering pt 2) (1991) 445.
H.-M. Choi and H.-J. Kwon, Text. Res. J. 63 (1993) 211.
B. Anczykowski, J.P. Cleveland, D. Kruger, V. Elings and H. Fuchs, Appl. Phys. A 66 (1998) S885.
T.R. Rodriguez and R. Garcia, Appl. Phys. Lett. 82 (2003) 4821.
A. Schirmeisen, B. Anczykowski and H. Fuchs, in Applied Scanning Probe Methods, edited by B. Bushan, H. Fuchs and S. Hosaka (Springer-Verlag, Berlin, 2003), p. 3.
A. Humphris, A. Round and M. Miles, Surf. Sci. 491 (2001) 468.
T. Sulcheck, R. Hsieh, J. Adams, G. Yaralioglu, S. Minne, C. Quate, J. Cleveland, A. Atalar and D. Adderton, Appl. Phys. Lett. 76 (2000) 1473.
M. Tortonese, R. Barrett and C. Quate, Appl. Phys. Lett. 62 (1993) 834.
R. Erlandsson, G. McClelland, C. Mate and S. Chiang, J. Vac. Sci. Technol. A 6 (1988) 266.
A. Ruf, M. Abraham, J. Diebel, W. Ehrfeld, P. Guenther, M. Lacher, K. Mayr and J. Reinhardt, J. Vac. Sci. Technol. B 15 (1997) 579.
S. Alexander, L. Hellemans, O. Marti, J. Schneir, V. Elings, P. Hansma, M. Longmire and J. Gurley, J. Appl. Phys. 65 (1989) 164.
S. Magonov and D. Reneker, Annu. Rev. Mater. Sci. 27 (1997) 175.
R. Colton, J. Vac. Sci. Technol. B 22 (2004) 1609.
D. Chernoff and S. Magonov, in Comprehensive Desk Reference of Polymer Characterization and Analysis, edited by R. Brady (Oxford University Press, New York, 2003).
G. Binnig, C. Gerber and C.F. Quate, Phys. Rev. Lett. 56 (1986) 930.
J. Israelachvilli, Surface and Intermolecular Forces, 2nd Edition: With Applications to Biological and Colloidal Systems (Academic Press, New York, 1992).
J.B. Pethica and P. Sutton, J. Vac. Sci. Technol. A 6 (1988) 2400.
N.A. Burnham, R.J. Colton and H.M. Pollock, J. Vac. Sci. Technol. A 9 (1991) 2548.
S.P. Jarvis, H. Yamada, S.-I. Yamamoto and J.B. Pethica, Nature 384 (1996) 248.
W. Heinz and J. Hoh, in Trends Biotechnol. 17 (1999) 143.
H.-J. Butt, B. Cappella and M. Kappl, Surf. Sci. Rep. 59 (2005) 1.
K. Feldman, G. Hahner and N. Spencer, in Microstructure and Microtribology of Polymer Surfaces, edited by V. Tsukruk and K.J. Wahl (American Chemical Society, Washington, DC, 2000), p. 272.
G. Meyers, B. DeKoven and J. Seitz, Langmuir 8 (1992) 2330.
C. Mate, G. McClelland, R. Erlandsson and S. Chiang, Phys. Rev. Lett. 59 (1987) 1942.
R. Carpick and M. Salmeron, Chem. Rev. 97 (1997) 1163.
M. Paige, Polymer 44 (2003) 6345.
S. Breakspear, J. Smith, T. Nevell and J. Tsibouklis, Surf. Interface Anal. 36 (2004) 1330.
K. Feldman, T. Tervoort, P. Smith and N. Spencer, Langmuir 14 (1998) 372.
G.J. Vancso and H. Schonherr, in Microstructure and Microtribology of Polymer Surfaces, edited by V. Tsukruk and K.J. Wahl (American Chemical Society, Washington, DC, 2000), p. 317.
R. Piner and C. Mirkin, Langmuir 13 (1997) 6864.
M. Motomatsu, H.-Y. Nie, W. Mizutani and H. Tokumoto, Thin Solid Films 273 (1996) 304.
G. Haugstad, W. Gladfelter, E. Weberg, R. Weberg and R. Jones, Tribol. Lett. 1 (1995) 253.
R. Cain, S. Biggs and N. Page, J. Colloid Interface Sci. 227 (2000) 55.
R. Piner and R. Ruoff, Rev. Sci. Instrum. 73 (2002) 3392.
P. Maivald, H.-J. Butt, S. Gould, C. Prater, B. Drake and J. Gurley, Nanotechnology 2 (1991) 103.
B. Nysten, C. Meerman and E. Tomasetti, in Microstructure and Microtribology of Polymer Surfaces, edited by V. Tsukruk and K.J. Wahl (American Chemical Society, Washington, DC, 2000), p. 304.
A. Galuska, R. Polter and K. McElrath, Surf. Interface Anal. 25 (1997) 418.
A.L. Weisenhorn, M. Khorsandi, M. Kasas, V. Gotzos and H.-J. Butt, Nanotechnology 4 (1993) 106.
B. Beake, G. Leggett and P. Shipway, Surf. Interface Anal. 27 (1999) 1084.
H. Schonherr, C. Feng, N. Tomczak and G.J. Vancso, Macromol. Symp. 230 (2005) 149.
G. Willing, T. Ibrahim, F. Etzler and R. Neuman, J. Colloid Interface Sci. 226 (2000) 185.
F. Arce, R. Avci, I. Beech, K. Cooksey and B. Wigglesworth-Cooksey, J. Chem. Phys. 119 (2003) 1671.
Y. Jiao and T. Schaffer, Langmuir 20 (2004) 10038.
Q. Zhong, D. Inniss, K. Kjoller and V. Elings, Surf. Sci. Lett. 290 (1993) L688.
S. Magonov, in Applied Scanning Probe Methods, edited by B. Bushan, H. Fuchs and S. Hosaka (Springer-Verlag, Berlin, 2003), p. 207.
W. Han, S. Lindsay and T. Jing, Appl. Phys. Lett. 69 (1996) 4111.
R. Garcia and R. Perez, Surf. Sci. Rep. 47 (2002) 197.
G. Bar, Y. Thoman and M.-H. Wangbo, Langmuir 14 (1998) 1219.
A. Pfau, A. Janke and W. Heckman, Surf. Interface Anal. 27 (1999) 410.
G. Bar and G. Meyers, MRS Bull. July (2004) 464.
P. Gleyzes, P. Kuo and C. Boccara, Appl. Phys. Lett. 58 (1991) 2989.
R. Garcia and A.S. Paulo, Phys. Rev. B 60 (1999) 4961.
G. Haugstad and R.R. Jones, Ultramicroscopy 76 (1999) 77.
J.P. Cleveland, B. Anczykowski, A.E. Schmid and V.B. Elings, Appl. Phys. Lett. 72 (1998) 2613.
B. Anczykowski, B. Gotsmann, H. Fuchs, J.P. Cleveland and V.B. Elings, Appl. Surf. Sci. 140 (1999) 376.
G. Bar, M. Ganter, R. Brandsch, L. Delineau and M.-H. Whangbo, Langmuir 16 (2000) 5702.
T.R. Albrecht, P. Grutter, D. Home and D. Rugar, J. Appl. Phys. 69 (1991) 668.
F.J. Giessibl, Rev. Mod. Phys. 75 (2003) 949.
S. Tanaka, B. Grevin, P. Rannou, H. Suziki and S. Mashiko, Thin Solid Films 499 (2006) 168.
M. Brun, S. Decossas, F. Triozon, R. Rannou and B. Grevin, Appl. Phys. Lett. 87 (2005) 133101.
A. Schirmeisen, D. Weiner and H. Fuchs, Surf. Sci. 545 (2003) 155.
Y. Martin, D.A. Abraham and H.K. Wickramasinghe, Appl. Phys. Lett. 52 (1987) 1103.
Y. Martin and H.K. Wickramasinghe, Appl. Phys. Lett. 50 (1987) 1456.
N. Yerina and S. Magonov, Rubber Chem. Technol. 76 (2003) 846.
A.V. Krayev and R.V. Talroze, Polymer 45 (2004) 8195.
M. Meincken, L.J. Balk and R.D. Sanderson, Macromol. Mater. Eng. 286 (2001) 412.
P. West and N. Starostina, Microsc. Today 11 (2003) 20.
A. Mendez-Vilas, M.L. Gonzalez-Martin and M.J. Nuevo, Ultramicroscopy 92 (2002) 243.
ASTM E2382-04, Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy, in ASTM Annual Book of Standards, Vol. 03.06 (2004).
R. Howland, in Atomic Force Microscopy/Scanning Tunneling Microscopy, edited by S.H. Cohen, M.T. Bray and M.L. Lightbody (Plenum Press, New York, 1994), p. 347.
S.M. Hues, C.F. Draper, K.P. Lee and R.J. Colton, Rev. Sci. Instrum. 65 (1994) 1561.
J. Fu, Rev. Sci. Instrum. 66 (1995) 3785.
J.E. Griffith and D.A. Grigg, J. Appl. Phys. 74 (1993) R83.
D. Snevity and J. Vancso, Langmuir 9 (1993) 2253.
X. Tian, N. Xi, Z. Dong and Y. Wang, Ultramicroscopy 105 (2005) 336.
ASTM E1813-96, Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy, in ASTM Annual Book of Standards, Vol. 03.06 (2002).
K.L. Westra, A.W. Mitchell and D.J. Thomson, J. Appl. Phys. 74 (1993) 3608.
T. Thundat, X.Y. Zheng, S.L. Sharp, D.P. Allison, R.J. Warmack, D.C. Joy and T.L. Ferrell, Scanning Microsc. 6 (1992) 903.
J. Vesenka, M. Guthold, C. Tang, D. Keller, E. Delaine and C. Bustamante, Ultramicroscopy 42–44 (1992) 1243.
D. Keller, Surf. Sci. 235 (1991) 353.
G.S. Pingali and R.C. Jain, Proc. SPIE Int. Soc. Opt. Eng. 1823 (1992) 151.
U.D. Schwarz, H. Haefke, P. Reimann and H.-J. Guntherodt, J. Microsc. 173 (1994) 183.
J. Vesenka, S. Manne, R. Giberson, T. Marsh and E. Henderson, Biophys. J. 65 (1993) 992.
S. Xu and M.F. Arnsdorf, J. Microsc. 173 (1994) 199.
C. Odin and J.P. Aime, Surf. Sci. 317 (1994) 321.
M.J. Allen, N.V. Hud, M. Balooch, R.J. Tench, W.J. Siekhaus and R. Balhorn, Ultramicroscopy 42 (1992) 1095.
J.S. Villarrubia, in Applied Scanning Probe Methods, edited by B. Bushan, H. Fuchs and S. Hosaka (Springer-Verlag, Berlin, 2003), p. 147.
J.S. Villarrubia, Surf. Sci. 321 (1994) 287.
J.S. Villarrubia, J. Vac. Sci. Technol. B 14 (1996) 1518.
J.S. Villarrubia, J. Res. Natl. Inst. Stand. Technol. 102 (1997) 425.
S. Dongmo, M. Troyon, P. Vautrot, E. Delain and N. Bonnet, J. Vac. Sci. Technol. B 14 (1996) 1552.
S. Dongmo, J.S. Villarrubia, S.N. Jones, T.B. Renegar, M.T. Postek and J.F. Song, AIP Conference Proc. 449 (1998) 843.
L.S. Dongmo, J.S. Villarrubia, S.N. Jones, T.B. Renegar, M.T. Postek and J.F. Song, Ultramicroscopy 85 (2000) 141.
P. Grutter, W. Zimmermann-Edling and D. Brodbeck, Appl. Phys. Lett. 60 (1992) 2741.
H.Y. Nie, M.J. Walzak and N.S. McIntyre, Rev. Sci. Instrum. 73 (2002) 3831.
G. Bar, Y. Thoman, R. Brandsh and H.-J. Cantow, Langmuir 13 (1997).
H.-Y. Nie and N.S. McIntyre, Langmuir 17 (2001) 432.
G. Hughes, Radiation Chemistry (Clarendon Press, Oxford, 1973).
M. Dole, Ed. The Radiation Chemistry of Macromolecules (Academic Press, New York, 1973).
R.L. Clough, S.W. Shalaby and Eds. Radiation Effects on Polymers, ACS Symposium Series, 475 (ACS, Washington, DC, 1991).
A. Charlesby, Atomic Radiation and Polymers (Pergamon, Oxford, 1960).
A. Chapiro, Radiation Chemistry of Polymeric Systems (Interscience, New York, 1962).
S. Okamura, Recent Trends in Radiation Polymer Chemistry (Springer-Verlag, Berlin, 1993).
G.F. Bahr, F.B. Johnson and E. Zeitler, Lab. Invest. 14 (1965) 1115.
B.M. Siegel, D.R. Beaman and Eds. Physical Aspects of Electron Microscopy and Microbeam Analysis (Wiley, New York, 1975).
M.S. Isaacson, in Principles and Techniques of Electron Microscopy, edited by M. Hayat (Van-Nostrand Reinhold, New York, 1977).
D.T. Grubb, in Developments in Crystalline Polymers, edited by D.C. Bassett (Applied Science, London & New York, 1982).
E.L. Thomas, in Structure of Crystalline Polymers, edited by I.H. Hall (Applied Science, London, 1984).
P. Alexander and A. Charlesby, Nature 173 (1954) 578.
H. Kiho and P. Ingram, Makromol. Chem. 118 (1968) 45.
P.B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley and M.J. Whelan, Electron Microscopy of Thin Crystals (Butterworths, London, 1965).
B. Gale and K.F. Hale, Br. J. Appl. Phys. 12 (1961) 115.
J. Ling, Br. J. Appl. Phys. 18 (1967) 991.
L.G. Pittaway, Br. J. Appl. Phys. 15 (1964) 967.
Y. Talmon and E.L. Thomas, J. Microsc. 111 (1977) 151.
H. Kohl, H. Rose and H. Schnabl, Optik 58 (1981) 11.
V.E. Cosslett. Proc. Europ. Conf. on Electron Microscopy, edited by A.L. Houwink and B.J. Spit (Nederlandse Vereniging voor Electronenmikroskopie, Delft, 1960).
R. Freemen and K.R. Leonard, J. Microsc. 122 (1981) 275.
J.W. Heavens, A. Keller, J.M. Pope and D.M. Rowell J. Mater. Sci. 5 (1970) 53.
M.S. Isaacson, Ultramicroscopy 4 (1979) 193.
R.F. Egerton, Ultramicroscopy 5 (1980) 521.
R.F. Egerton, J. Microsc. 126 (1982) 96.
B.D. Lauterwasser and E.J. Kramer, Philos. Mag. A39 (1979) 469.
D. Vesely, Polym. Eng. Sci. 36 (1996) 1586.
K. Kobayashi and K. Sakaoku, Lab. Invest. 14 (1965) 1097.
D.T. Grubb, J. Phys. E Sci. Instrum. 4 (1971) 222.
D.L. Dorset and F. Zemlin, Ultramicroscopy 17 (1985) 229.
D.T. Grubb and G.W. Groves, Philos. Mag. 24 (1971) 815.
F.P. Price, J. Polym. Sci. 37 (1959) 71.
J. Dlugosz and A. Keller, J. Appl. Phys. 39 (1968) 5776.
D.T. Grubb and A. Keller, J. Mater. Sci. 7 (1972) 822.
D.T. Grubb, A. Keller and G.W. Groves, J. Mater. Sci. 7 (1972) 131.
E.H. Andrews, Proc. Roy. Soc. A270 (1962) 232.
C.G. Cannon and P.H. Harris, J. Macromol. Sci. Phys. B3 (1969) 357.
J. Dlugosz, D.T. Grubb, A. Keller and M.B. Rhodes, J. Mater. Sci. 7 (1972) 142.
J.E. Breedon, J.F. Jackson, M.J. Marcinkowski and M.E. Taylor, J. Mater. Sci. 8 (1973) 1071.
D. Fotheringham and B. Paker, J. Mater. Sci. 11 (1976) 979.
S. Bandyopadhy and H.R. Brown, Polymer 19 (1978) 589.
Y. Chen and J.B. Pawley, in Multidimensional Microscopy edited by P.C. Cheng, T.H. Lin, W.L. Wu and J.L. Wu (Springer-Verlag, Berlin, 1994).
C.P. Royall, B.L. Thiel and A.M. Donald, J. Microsc. 204 (2001) 185.
E.L. Thomas and D.G. Ast, Polymer 15 (1974) 37.
R.M. Glaeser, J. Ultrastruct. Res. 36 (1976) 466.
L. Yin, Polymer 44 (2003) 6489.
D.L. Misell, J. Phys D Appl. Phys. 10 (1977) 1085.
R.C. Williams and H.W. Fischer, J. Mol. Biol. 52 (1970) 121.
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(2008). Image Formation in the Microscope. In: Polymer Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-72628-1_3
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