Process Variations for Security: PUFs

  • Roel MaesEmail author
  • Pim Tuyls
Part of the Integrated Circuits and Systems book series (ICIR)


Process variations in deep-submicron technology lead usually to undesired effects. Manufacturers of ICs try to remove those as much as possible in order to be sure that all their devices function in the same and expected way. In this chapter, we show how process variations which make a device unique can be used to provide new, cheap and enhanced security functionality to the device. We identify physical unclonable functions (PUFs) based on process variations that are present on an IC and explain how they can be used to provide enhanced security features for the IC.


Enrolment Phase SRAM Cell Physical Unclonable Function Secrecy Capacity Helper Data 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  1. 1.Katholieke Universiteit Leuven, ESAT/COSICLeuven-HeverleeBelgium
  2. 2.Intrinsic-IDEindhovenThe Netherlands

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