One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key parameters affecting performance of integrated circuits [6]. Several taxonomies can be used to describe the different variability mechanisms, according to their causes, spatial scales, the particular IC layer they impact, and whether their ability can be described using non-stochastic models. Here we briefly discuss these taxonomies.


Correlation Length Threshold Voltage Gate Length Dopant Atom Gate Width 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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© Springer Science+Business Media, LLC 2008

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