Power consumption is also strongly affected by manufacturing variability. It is especially true of leakage power because of the exponential dependencies of subthreshold and gate leakage currents on several process parameters. In this chapter we give an overview of leakage power variability and provide analytical methods for modeling it. This chapter also highlights the challenge of parametric yield loss due to the simultaneous impact of timing and power variability. Both timing and power variation need to be accounted for in estimating the overall parametric yield. This chapter introduces a quantitative yield model that can accurately handle the correlation between timing and power variability.
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© 2008 Springer Science+Business Media, LLC
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(2008). Leakage Variability And Joint Parametric Yield. In: Design for Manufacturability and Statistical Design. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-69011-7_11
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DOI: https://doi.org/10.1007/978-0-387-69011-7_11
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-30928-6
Online ISBN: 978-0-387-69011-7
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