Leakage Variability And Joint Parametric Yield

Power consumption is also strongly affected by manufacturing variability. It is especially true of leakage power because of the exponential dependencies of subthreshold and gate leakage currents on several process parameters. In this chapter we give an overview of leakage power variability and provide analytical methods for modeling it. This chapter also highlights the challenge of parametric yield loss due to the simultaneous impact of timing and power variability. Both timing and power variation need to be accounted for in estimating the overall parametric yield. This chapter introduces a quantitative yield model that can accurately handle the correlation between timing and power variability.


Leakage Current Threshold Voltage Parametric Yield Oxide Thickness Clock Period 
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© Springer Science+Business Media, LLC 2008

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