For many ASIC designs, gate sizing is the main low level design technique used to reduce power. Gate sizing is a classical circuit optimization problem for which the same basic method has been used for the past 20 years. The standard approach is to compute a sensitivity metric, for example for the power versus delay tradeoff for upsizing, and then greedily resize the gate with highest sensitivity, iterating this process until there is no further improvement. Such methods are relatively fast, with quadratic runtime growth versus circuit size, but they are known to be suboptimal. The challenge has been to find a better approach that still has fast runtimes.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Berkelaar, M., and Jess, J., “Gate sizing in MOS digital circuits with linear programming, ” in Proceedings of the European Design Automation Conference, 1990, pp. 217-221.
Brglez, F., and Fujiwara, H., “A neutral netlist of 10 combinational benchmark circuits and a target translator in Fortran, ” in Proceedings of the International Symposium Circuits and Systems, 1985, pp. 695-698.
Chandrakasan, A., and Brodersen, R., “Minimizing Power Consumption in Digital CMOS Circuits, ” in Proceedings of the IEEE, vol. 83, no. 4, April 1995, pp. 498-523.
Chinnery, D Low Power Design Automation, Ph. D. dissertation, Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, 2006.
Dharchoudhury, A., Blaauw, D., Norton, J., Pullela, S., and Dunning, J., “Transistor-level sizing and timing verification of domino circuits in the Power PC microprocessor, ” in Proceedings of the International Conference on Computer Design, 1997, pp. 143-148.
Fishburn, J., and Dunlop, A., “TILOS: A Posynomial Programming Approach to Transistor Sizing, ” in Proceedings of the International Conference on Computer-Aided Design, 1985, pp. 326-328.
Forrest, J., Nuez, D., and Lougee-Heimer, R., CLP User Guide, http://www.coin-or. org/ Clp/userguide/
Goering, R., “The battle for logic synthesis, ” EE Times, September 9, 2004. http:// www.eetimes. com/news/design/columns/tool_talk/showArticle. jhtml?articleID=46200731
Hansen, M., Yalcin, H., Hayes, J., ISCAS High-Level Models. http://www.eecs. umich. edu/∼jhayes/iscas. restore/benchmark. html
Hansen, M., Yalcin, H., Hayes, J., “Unveiling the ISCAS-85 Benchmarks: A Case Study in Reverse Engineering, ” IEEE Design & Test of Computers, vol. 16, no. 3, 1999, pp. 72-80.
ILOG, ILOG CPLEX 10. 1 User’s Manual, July 2006, 476 pp.
Jacobs, E., “Speed-Accuracy Trade-off in Gate Sizing, ” in Proceedings of the workshop on Circuits, Systems and Signal Processing, 1997, pp. 231-238.
Kasamsetty, K., Ketkar, M. and Sapatnekar, S., “A New Class of Convex Functions for Delay Modeling and their Application to the Transistor Sizing Problem, ” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 19, no. 7, 2000, pp. 779-788.
Kulkarni, S., Srivastava, A., and Sylvester, D., “A New Algorithm for Improved VDD Assignment in Low Power Dual VDD Systems, ” International Symposium on Low-Power Electronics Design, 2004, pp. 200-205.
Nair, R., et al., “Generation of Performance Constraints for Layout, ” IEEE Transactions on Computer-Aided Design, vol. 8, no. 8, 1989, pp. 860-874.
Narendra, S., et al., “Comparative Performance, Leakage Power and Switching Power of Circuits in 150 nm PD-SOI and Bulk Technologies Including Impact of SOI History Effect, ” Symposium on VLSI Circuits, 2001, pp. 217-8.
Nguyen, D., et al., “Minimization of Dynamic and Static Power Through Joint Assign-ment of Threshold Voltages and Sizing Optimization, ” International Symposium on Low Power Electronics and Design, 2003, pp. 158-163.
Nikolić, B., et al., “Layout Decompression Chip for Maskless Lithography, ” in Emerging Lithographic Technologies VIII, Proceedings of SPIE, vol. 5374, 2004, 8 pp.
Pant, P., Roy, R., and Chatterjee, A., “Dual-Threshold Voltage Assignment with Transistor Sizing for Low Power CMOS Circuits, ” IEEE Transactions on VLSI Systems, vol. 9, no. 2, 2001, pp. 390-394.
Satish, N et al., “Evaluating the Effectiveness of Statistical Gate Sizing for Power Optimization, ” Department of Electrical Engineering and Computer Science, University of California, Berkeley, California, ERL Memorandum M05/28, August 2005.
Sirichotiyakul, S., et al., “Stand-by Power Minimization through Simultaneous Threshold Voltage Selection and Circuit Sizing, ” in Proceedings of the Design Automation Confe-rence, 1999, pp. 436-41.
Srivastava, A., Sylvester, D., and Blaauw, D., “Power Minimization using Simultaneous Gate Sizing Dual-Vdd and Dual-Vth Assignment, ” in Proceedings of the Design Auto-mation Conference, 2004, pp. 783-787.
Synopsys, Design Compiler User Guide, version U-2003. 06, June 2003, 427 pp.
Tennakoon, H., and Sechen, C., “Gate Sizing Using Lagrangian Relaxation Combined with a Fast Gradient-Based Pre-Processing Step, ” in Proceedings of the International Conference on Computer-Aided Design, 2002, pp. 395-402.
Wei, L., et al., “Mixed-Vth (MVT) CMOS Circuit Design Methodology for Low Power Applications, ” in Proceedings of the Design Automation Conference, 1999, pp. 430-435.
Yeo, E., et al., “A 500-Mb/s Soft-Output Viterbi Decoder, ” IEEE Journal of Solid-State Circuits, vol. 38, no. 7, 2003, pp. 1234-1241.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2007 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Chinnery, D., Keutzer, K. (2007). Linear Programming for Gate Sizing. In: Closing the Power Gap Between ASIC & Custom. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-68953-1_6
Download citation
DOI: https://doi.org/10.1007/978-0-387-68953-1_6
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-25763-1
Online ISBN: 978-0-387-68953-1
eBook Packages: EngineeringEngineering (R0)