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Variability Issue in the Nanometer Era

  • Kiyoo Itoh
  • Masashi Horiguchi
  • Hitoshi Tanaka
Part of the Series On Integrated Circuits And Systems book series (ICIR)

Keywords

Logic Circuit Speed Spread SRAM Cell Dynamic Voltage Scaling Sense Amplifier 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+ Business Media, LLC 2007

Authors and Affiliations

  • Kiyoo Itoh
    • 1
  • Masashi Horiguchi
    • 2
  • Hitoshi Tanaka
    • 3
  1. 1.Hitachi, LtdTokyoJapan
  2. 2.Renesas Technology CorpTokyoJapan
  3. 3.Hitachi ULSI Systems Co., LtdTokyoJapan

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