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Itoh, K., Horiguchi, M., Tanaka, H. (2007). Variability Issue in the Nanometer Era. In: Itoh, K., Horiguchi, M., Tanaka, H. (eds) Ultra-Low Voltage Nano-Scale Memories. Series On Integrated Circuits And Systems. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-68853-4_5
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