In response to the European Union (EU) Restriction of Hazardous Substances (RoHS) and other countries’ impending lead-free directives, the electronics industry is moving toward lead-free soldering. Total lead-free soldering requires not only lead-free solder paste but also lead-free printed circuit board (PCB) finish and lead-free component/packages. Transitioning tin-lead (SnPb) soldering to totally lead-free soldering is a complex issue and involves movement of the whole electronics industry supply chain. In reality, there is a transition period.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Smetana J, Horsley R, Lau J, Snowdon K, Shangguan D, Gleason J, Memis I, Love D, Dauksher W, Sullivan B (2004) Design, materials and process for lead-free assembly of high-density packages. Soldering & Surface Mount Technology, 16 (1): 53-62.
Handwerker C, Bath J, Benedetto E, Bradley E, Gedney R, Siewert T, Snugovsky P, Sohn J (2003) NEMI Lead-free Assembly Project: Comparison Between PbSn and SnAgCu Reliability and Microstructures. In: Proceedings of the SMTA International Conference. l3. Lau JH, Liu K (2004) Global trends of lead-free soldering. Advanced Packaging Jan. 2004.
Grossmann G, Tharian J, Jud P, Sennhauser U (2005) Microstructural investigation of lead-free BGAs soldered with tin-lead solder. Soldering & Surface Mount Technology 17 (2): 10-21.
Bath J, Sethuraman S, Zhou X, Willie D, Hyland K, Newman K, Hu L, Love D, Reynolds H, Kochi K, Chiang D, Chin V, Teng S, Ahmed M, Henshall G, Schroeder V, Nguyen Q, Maheswari A, Lee MJ, Clech J-P, Cannis J, Lau J, Gibson C (2005) Reliability Evaluation of Lead-free SnAgCu PBGA676 Components using Tin-Lead and Lead-free SnAgCu solder paste. In: Proceedings of 2005 SMTA International, Chicago, IL, 891-901.
Zbrzezny AR, Snugovsky P, Lindsay T, Lau R (2005) Reliability Investigation of Sn-Ag-Cu BGA Memory Modules Assembled with Sn-Pb Eutectic Paste Using Different Reflow Profiles. In: International Conference on Lead-free Soldering, CMAP, Toronto, Ontario, Canada, May 24-26, 2005.
Hua F, Aspandiar R, Anderson C, Clemons G, Chung C, Faizul M (2003a) Solder Joint Reliability Assessment of Sn-Ag-Cu BGA Components Attached with Eutectic Pb-Sn Solder. In: SMTA International 2005, Chicago, IL, pp. 246-252.
Nandagopal B, Chiang D, Teng S, Thune P, Anderson L, Jay R, Bath J (2005) Study on Assembly, Rework, Microstructures and Mechanical Strength of Backward Compatible Assembly. In: Proceedings of 2005 SMTA International, Chicago, IL, pp. 861-870.
Nandagopal B, Mei Z, Teng S (2006) Microstructure and Thermal Fatigue Life of BGAs with Eutectic Sn-Ag-Cu Balls Assembled at 210°C with Eutectic Sn-Pb Solder Paste. In: Proceedings of 2006 IEEE Electronic Components and Technology Conference, San Diego, CA, pp. 875-883.
Handwerker, C. (2005) Transitioning to Lead-free Assemblies, Printed Circuit Design and Manufacture, March Issue, pp. 17-23.
Snugovsky P, Zbrzezny AR, Kelly M, Romansky M (2005) Theory and Practice of Lead-free BGA Assembly using Sn-Pb Solder. In: International Conference on Lead-free Soldering, CMAP, Toronto, Ontario, Canada, May 24-26, 2005.
Hillman D, Wells M, Cho K (2005) The Impact of Reflowing a Pb free Solder Alloy Using a Tin/Lead Solder Alloy Reflow Profile on Solder Joint Integrity. In: International Conference on Lead-free Soldering, CMAP, Toronto, Ontario, Canada, May 24-26, 2005.
Gregorich T, Holmes P (2003) Low-Temperature, High Reliability Assembly of Lead-free CSPS. In: IPC/JEDEC 4th International Conference on Lead-free Electronic Components and Assemblies, Frankfurt, Germany, 2003.
Hua F, Aspandiar R, Rothman T, Anderson C, Clemons G, Klier M (2003b) Solder Joint Reliability of Sn-Ag-Cu BGA Components Attached with Eutectic Pb-Sn Solder Pate. Journal of Surface Mount Technology 16 (1): 34-42.
Sun F (2005) Solder Joint Reliability of Sn-Ag-Cu BGA and Sn-Pb Solder Paste. In: Proceedings of the 6th IEEE International Conference on Electronic Packaging Technology, Shenzhen, China.
Theuss H, Kilger T, Ort T (2003) Solder Joint Reliability of Lead-Free Solder Balls Assembled with SnPb Solder Paste. In: Proceedings of 2003 IEEE Electronic Components and Technology Conference, New Orleans, LA, pp. 331-337.
iNEMI (2006) Backward Compatibility Project Presentation. In: IPC Printed Circuits Expo, APEX and the Designers Summit, NEMI forum, Anaheim, CA, Feb. 8-10.
Pan J (2006) Estimation of Liquidus Temperature when SnAgCu BGA/CSP Components are Soldered with SnPb Paste. In: Proceedings of the 7th International Conference on Electronics Packaging Technology, Shanghai, China.
Pan J, Bath J (2006) Lead Free Soldering Backward Compatibility. In: IPC/JEDEC 12th International Conference on Lead Free Electronic Components and Assemblies, Santa Clara, CA, March 7-9, 2006.
Siewert T, Liu S, Smith DR, Madeni JC (2002) Database for solder properties with emphasis on new lead-free solders. NIST & Colorado School of Mines, Release 4.0, Feb. 2002, http://www.boulder.nist.gov/div853/lead free/solders.html
Kattner UR, Handwerker C (2001) Calculation of Phase Equilibria in Candidate Solder Alloys. Z. Metallkd. 92: 1-10.
Kattner UR, Handwerker C (2005) personal communication though emails.
Zhu Q, Sheng M, Luo L (2000) The effect of Pb contamination on the microstructure and mechanical properties of SnAg/Cu and SnSb/Cu solder joints in SMT. Soldering and Surface Mount Technology, 12 (3): 19-23.
Zeng X (2005) Thermodynamic analysis of influence of Pb contamination on Pb-free solder joint reliability. Journal of Alloys and Compounds, 348: 184-188.
Nurmi ST, Ristolainen (2002) Reliability of Tin-lead Balled BGAs Soldered with Lead-free Solder Paste. Soldering and Surface Mount Technology, 14 (2): 35-39.
Hunt C and Wickham M (2006) Impact of Lead Contamination on Reliability of Lead Free Alloys. In: Proceedings of IPC Printed Circuits Expo, APEX and the Designers Summit, Anaheim, CA, Feb. 8-10, S39-01-1 -11.
Practical Components webpage at http://www.practicalcomponents.com/
Topline webpage at http://www.topline.tv/
Moon K, Boettinger WJ, Kattner UR, Handwerker CA, and Lee D (2001) The Effect of Pb contamination on the Solidification Behavior of Sn-Bi Solders. Journal of Electronic Materials, 30 (1), 45-52.
JEDEC/IPC (2006) Current Tin Whiskers Theory and Mitigation Practices Guideline. March.
Henshall G, Roubaud P and Chew G (2002) Impact of Component Terminal Finish on the Reliability of Pb-free Solder Joints. In: Proceedings of the SMTA International Conference.
Lau J, Hoo N, Horsley R, Smetana J, Shangguan D, Dauksher W, Love D, Menis I, Sullivan B (2004) Reliability Testing and Data Analysis of Lead-free Solder Joints for High-density Packages. Soldering and Surface Mount Technology, 16 (2): 46-68.
Seelig K and Suraski D (2001) Advances Issues in Assembly: Part 1 Lead Contamination in Lead-free Assembly. In: SMT Magazine, October.
Solectron internal data.
Verhelst E and Ocket T (2002) Lead-free manufacturing: Effects on press-fit connections. White Paper, Tyco Electronics.
Pal I, Smolentseva E (2006) An Experimental Study of Press-fit Interconnection on Lead Free Plating Finishes. In: Proceedings of SMTAI, Chicago, IL.
Chou GJS and Hilty RD (2003) Effects of Lead-free Surface Finishes on Press-fit Connections. In: Proceedings of the IPC Annual Meeting, Minneapolis, MN.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2007 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Pan, J., Bath, J., Zhou, X., Willie, D. (2007). Backward and Forward Compatibility. In: Bath, J. (eds) Lead-Free Soldering. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-68422-2_7
Download citation
DOI: https://doi.org/10.1007/978-0-387-68422-2_7
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-32466-1
Online ISBN: 978-0-387-68422-2
eBook Packages: EngineeringEngineering (R0)