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Scanning Force Microscopies for Imaging and Characterization of Nanostructured Materials

  • Bartosz Such
  • Franciszek Krok
  • Marek Szymonski
Part of the Nanostructure Science and Technology book series (NST)

Abstract

The growing tendency to miniaturize devices used in every-day life (e.g., integrated circuits or technologies for optical information transfer), as well as exciting prospects of new emerging technologies (quantum electronics, biochips, etc.) are prompting a huge interest in nanotechnology and the science of nanostructured materials. In particular, there is a need to develop efficient technologies for the preparation of surfaces with desired structure and electronic properties. In light of those advances, designing analytical and nondestructive tools for the characterization of surface electronic and chemical properties with nanometer resolution is of utmost importance. Such tools are important for both nanostructure characterization and nanomanipulation of small-size assemblies of atoms and/or molecules on crystal surfaces in order to construct nanodevices. Furthermore, local determination of surface morphology and mechanical as well as electronic properties might be important for practical functioning of various nanosensors and nanodevices in biological objects.

Keywords

Atomic Force Microscopy Scan Tunneling Microscopy Scan Probe Microscopy Tunneling Current Atomic Resolution 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  • Bartosz Such
    • 1
  • Franciszek Krok
    • 1
  • Marek Szymonski
    • 1
  1. 1.Centre for Nanometer-Scale Science and Advanced Materials (NANOSAM), Institute of PhysicsJagiellonian UniversityKrakowPoland

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