Effective Properties of Randomly Layered Media

Fouque, Jean-Pierre; Garnier, Josselin; Papanicolaou, George; Sølna, Knut

doi:10.1007/978-0-387-49808-9_4

Jean-Pierre Fouque⁷,
Josselin Garnier⁸,
George Papanicolaou⁹ &
…
Knut Sølna¹⁰

Part of the book series: Stochastic Modelling and Applied Probability ((SMAP,volume 56))

2086 Accesses
9 Citations

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution

Chapter: USD 29.95; Price excludes VAT (USA)

eBook: USD 59.99; Price excludes VAT (USA)

Softcover Book: USD 79.99; Price excludes VAT (USA)

Hardcover Book: USD 99.99; Price excludes VAT (USA)

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Author information

Authors and Affiliations

Department of Statistics and Applied Probability, University of California, Santa Barbara, CA 93106-3110, USA
Jean-Pierre Fouque
UFR de Mathématiques, Université Paris VII, 2 Place Jussieu, 75251 Paris Cedex 05, France
Josselin Garnier
Mathematics Department, Stanford University, Stanford, CA 94305, USA
George Papanicolaou
Department of Mathemathics, University of California at Irvine, Irvine, CA 92697, USA
Knut Sølna

Authors

Jean-Pierre Fouque
View author publications
You can also search for this author in PubMed Google Scholar
Josselin Garnier
View author publications
You can also search for this author in PubMed Google Scholar
George Papanicolaou
View author publications
You can also search for this author in PubMed Google Scholar
Knut Sølna
View author publications
You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

Copyright information

About this chapter

Cite this chapter

Fouque, JP., Garnier, J., Papanicolaou, G., Sølna, K. (2007). Effective Properties of Randomly Layered Media. In: Wave Propagation and Time Reversal in Randomly Layered Media. Stochastic Modelling and Applied Probability, vol 56. Springer, New York, NY. https://doi.org/10.1007/978-0-387-49808-9_4

Download citation

DOI: https://doi.org/10.1007/978-0-387-49808-9_4
Publisher Name: Springer, New York, NY
Print ISBN: 978-0-387-30890-6
Online ISBN: 978-0-387-49808-9
eBook Packages: Mathematics and StatisticsMathematics and Statistics (R0)

Publish with us

Policies and ethics