Historically, transmission electron microscope (TEM) images have been recorded on film using exposure times of a few seconds. The use of the TEM, and especially the high-voltage electron microscope, for in situ experiments stimulated interfacing of video cameras with the microscope column. This enabled capture of frames with millisecond exposure times and interframe times of milliseconds and proved to be very useful for the study of dynamic phenomena with characteristic times that were consistent with the time resolution of the detectors, such as dislocation motion in deforming metals.
KeywordsElectron Pulse Energy Spread Space Charge Effect Convergence Angle Conventional Transmission Electron Microscope
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