High-Resolution Transmission Electron Microscopy (HRTEM) uses a self-supporting thin sample (typically tens of nanometes) illuminated by a highly collimated kilovolt electron beam. A series of magnetic electron lenses image the electron wavefield across the exit face of the sample onto a detector at high magnification. HRTEM has evolved from initial instrumentation constructed by Knoll and Ruska (1932a–c) to its current state where individual atom columns in a wide range of materials can be routinely imaged (Smith, 1997; Krakow et al., 1984) using sophisticated computer-controlled microscopes (Figure 1–1). For this reason HRTEM now occupies a central place in many characterization laboratories worldwide and has made a substantial contribution to key areas of materials science, physics, and chemistry [for key examples showing its wide ranging influence see the frontispiece in the book by Spence (2002)]. Instrument development for HRTEM also supports a substantial commercial industry of manufacturers.
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© 2007 Springer Science+Business Media, LLC
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Kirkland, A.I., Chang, S.L.Y., Hutchison, J.L. (2007). Atomic Resolution Transmission Electron Microscopy. In: Hawkes, P.W., Spence, J.C.H. (eds) Science of Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-49762-4_1
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