Atomic Resolution Transmission Electron Microscopy
High-Resolution Transmission Electron Microscopy (HRTEM) uses a self-supporting thin sample (typically tens of nanometes) illuminated by a highly collimated kilovolt electron beam. A series of magnetic electron lenses image the electron wavefield across the exit face of the sample onto a detector at high magnification. HRTEM has evolved from initial instrumentation constructed by Knoll and Ruska (1932a–c) to its current state where individual atom columns in a wide range of materials can be routinely imaged (Smith, 1997; Krakow et al., 1984) using sophisticated computer-controlled microscopes (Figure 1–1). For this reason HRTEM now occupies a central place in many characterization laboratories worldwide and has made a substantial contribution to key areas of materials science, physics, and chemistry [for key examples showing its wide ranging influence see the frontispiece in the book by Spence (2002)]. Instrument development for HRTEM also supports a substantial commercial industry of manufacturers.
KeywordsSpatial Frequency Objective Lens HRTEM Image Spherical Aberration Chromatic Aberration
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