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Atomic Resolution Transmission Electron Microscopy

  • Angus I. Kirkland
  • Shery L. -Y. Chang
  • John L. Hutchison

High-Resolution Transmission Electron Microscopy (HRTEM) uses a self-supporting thin sample (typically tens of nanometes) illuminated by a highly collimated kilovolt electron beam. A series of magnetic electron lenses image the electron wavefield across the exit face of the sample onto a detector at high magnification. HRTEM has evolved from initial instrumentation constructed by Knoll and Ruska (1932a–c) to its current state where individual atom columns in a wide range of materials can be routinely imaged (Smith, 1997; Krakow et al., 1984) using sophisticated computer-controlled microscopes (Figure 1–1). For this reason HRTEM now occupies a central place in many characterization laboratories worldwide and has made a substantial contribution to key areas of materials science, physics, and chemistry [for key examples showing its wide ranging influence see the frontispiece in the book by Spence (2002)]. Instrument development for HRTEM also supports a substantial commercial industry of manufacturers.

Keywords

Spatial Frequency Objective Lens HRTEM Image Spherical Aberration Chromatic Aberration 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media, LLC 2007

Authors and Affiliations

  • Angus I. Kirkland
    • 1
  • Shery L. -Y. Chang
    • 1
  • John L. Hutchison
    • 1
  1. 1.Department of MaterialsUniversity of OxfordUK

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