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High-Resolution Transmission Electron Microscopy for Nanocharacterization

  • Chapter
Book cover Functional Nanostructures

Part of the book series: Nanostructure Science and Technology ((NST))

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Abstract

The study of nanomaterials is not only limited to the characterization of their properties as an ensemble of nanoparticles, but also often extends to the study of individual nanoparticles. Variations in size, shape and internal structure of nanoparticles may influence the macroscopic properties of these materials. Therefore, research in nanotechnology is frequently aimed at developing materials with uniform size and shape. In some cases periodic arrangements of uniform particles are developed. These requirements pose significant technological challenges for the preparation of devices incorporating nanostructured materials. Testing of the desired uniformity or periodicity of nanomaterials cannot be done by optical inspection as the resolution of optical methods is not sufficient for the characterization of nanomaterials. While some structural properties can be inferred from the macroscopic properties of the whole device or the ensemble of nanoparticles, scattering methods (using X-rays or neutrons) measure structural properties by averaging over the irradiated volume.

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  1. Advanced Materials Processing and Analysis Center (AMPAC), University of Central Florida, 4000 Central Florida Blvd., Eng 1, #381, Orlando, FL, 32816

    Helge Heinrich

  2. Department of Physics, University of Central Florida, 4000 Central Florida Blvd., Eng 1, #381, Orlando, FL, 32816

    Helge Heinrich

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Heinrich, H. (2008). High-Resolution Transmission Electron Microscopy for Nanocharacterization. In: Seal, S. (eds) Functional Nanostructures. Nanostructure Science and Technology. Springer, New York, NY. https://doi.org/10.1007/978-0-387-48805-9_8

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