Abstract
The mechanical properties of Sn-rich solder alloys are directly related to their heterogeneous microstructure. Thus, numerical modeling of the properties of these alloys is most effective when the microstructure is explicitly incorporated into the model. In this review, we provide several examples where 2D and 3D microstructures have been used to model the material behavior using finite element modeling. These included (a) 3D visualization of the solder microstructure, (b) 3D microstructure-based modeling of tensile behavior, (c) 2D modeling of the effect of intermetallic volume fraction and morphology on shear behavior of solder joints, and (d) prediction of crack growth in solder joints. In all these cases, the experimentally observed behavior matches very well with the microstructure-based models.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
S. Kang, A.K. Sarkhel, J. Electron. Mater. 23, 701 (1994)
D.R. Frear, P.T. Vianco, Metall. Mater. Trans. A 25, 1509 (1994)
J. Glazer, Inter. Mater. Rev. 40, 65 (1995)
W.J. Plumbridge, C.R. Gagg, Proc. Inst. Mech. Engrs. L, J. Mater.: Des Appl. 214, 153 (2000)
M. Kerr, N. Chawla, Acta Mater. 52, 4527 (2004)
F. Ochoa, J.J. Williams, N. Chawla, J. Electron. Mater. 32, 1414 (2003)
F. Ochoa, J.J. Williams, N. Chawla, JOM 55, 56 (2003)
R.J. McCabe, M.E. Fine, Scripta Mater. 39, 189 (1998)
H. Rhee, J.P. Lucas, K.N. Subramanian, J. Mater. Sci. 13, 477 (2002)
C. Basaran, J. Jiang, Mech. Mater. 34, 349 (2002)
N. Chawla, F. Ochoa, S. Scaritt, M. Koopman, K.K. Chawla, V.V. Ganesh, X. Deng, J. Mater. Sci.: Mater. Electron. 15, 385 (2004)
N. Ramakrishna, V.S. Arunachalam, J. Am. Ceram. Soc. 76, 2745 (1993)
W.M. Sherry, J.S. Erich, M.K. Bartschat, F.B. Prinz, IEEE Trans. Comp., Hybrids Manuf. Tech. 8, 417 (1985)
D.G. Kim, H.S. Jang, J.W. Kim, S.B. Jung, J. Mater. Sci.: Mater. Elec. 16, 603 (2005)
S. Ling, A. Dasgupta, Trans. ASME 118, 72 (1996)
D.G. Kim, J.W. Kim, S.B. Jung, Microelec. Eng. 82, 575 (2005)
J.W. Kim, D.G. Kim, S.B. Jung, Microelec. Rel. 46, 535 (2006)
J.W. Kim, S.B. Jung, Microelec. Eng. 82, 554 (2005)
H. Ye, C. Basaran, D.C. Hopkins, Inter. J. Solid. Struct. 41, 4959 (2004)
C.J. Zhai, Sidharth, R. Blish II, IEEE Trans. Device Mater. Rel. 3, 207 (2003)
M.P. Rodriquez, N.Y.A. Shammas, A.T. Plumpton, D. Newcombe, D.E. Crees, Microelec. Rel. 40, 455 (2000)
J.H. Lau, IEEE Trans. Comp., Pack., Manuf. Tech. B 19, 728 (1996)
V. Sarihan, IEEE Trans. Comp., Pack., Manuf. Tech. B 17, 626 (1994)
C.G. Schmidt, J.W. Simons, C.H. Kanazawa, D.C. Elrich, IEEE Trans. Comp., Pack., Manuf. Tech. A 18, 611 (1995)
B.Z. Hong, J. Elec. Mater. 26, 814 (1997)
B.Z. Hong, J. Elec. Mater. 28, 1071 (1999)
B.Z. Hong, L.G. Burrell, IEEE Trans. Comp., Pack., Manuf. Tech. A 18, 585 (1995)
S.C. Chen, Y.C. Lin, C.H. Cheng, J. Mater. Proc. Tech. 171, 125 (2006)
E.E. Underwood, in Quantitative Microscopy, ed. by R.T Dehoof, F.N. Rhines (McGraw-Hill, New York, 1968), p. 149
B. Wunsch, X. Deng, N. Chawla, in Computational Methods in Materials Characterisation, ed. by A.A. Mammoli, C.A. Brebbia (WIT Press, Boston, 2004), pp. 175–184
R.S. Sidhu, N. Chawla, Mater. Charact. 52, 225 (2004)
M. Li, S. Ghosh, T.N. Rouns, H. Weiland, O. Richmond, W. Hunt, Mater. Charact. 41, 81 (1998)
M. Li, S. Ghosh, O. Richmond, H. Weiland, T.N. Rouns, Mater. Sci. Eng. A 265, 153 (1999)
M.V. Kral, M.A. Mangan, G. Spanos, R.O. Rosenberg, Mater. Charact. 45, 17 (2000)
T. Yokomizo, M. Enomoto, O. Umezawa, G. Spanos, R.O. Rosenberg, Mater. Sci. Eng. A 344, 261 (2003)
C.Y. Hung, G. Spanos, R.O. Rosenberg, M.V. Kral, Acta Mater. 50, 3781 (2002)
A.C. Lund, P.W. Voorhees, Acta Mater. 50, 2582 (2002)
K.M. Wu, M. Enomoto, Scripta Mater. 46, 569 (2002)
M. Yamaguchi, S.K. Biswas, Y. Suzuki, H. Furukawa, K. Takeo, FEMS Microbio. Lett. 219, 17 (2003)
A. Tewari, A.M. Gokhale, Mater. Charact. 46, 329 (2001)
M.V. Kral, G. Spanos, Acta Mater. 47, 711 (1999) Fig.
J. Alkemper, P.W. Voorhees, Acta Mater. 49, 897 (2001)
N. Chawla, K.K. Chawla, J. Mater. Sci. 41, 913–925 (2006)
N. Chawla, V.V. Ganesh, B. Wunsch, Scripta Mater. 51, 161 (2004)
N. Chawla, R.S. Sidhu, V.V. Ganesh, Acta Mater. 54, 1541 (2006)
X. Deng, N. Chawla, K.K. Chawla, M. Koopman, Acta Mater. 52, 4291 (2004)
W. Yang, L.E. Felton, R.W. Messler, J. Electron. Mater. 24, 1465 (1995)
K.N. Tu, R.D. Thompson, Acta Metall. 30, 947 (1982)
X. Deng, G. Piotrowski, J.J. Williams, N. Chawla, J. Electron. Mater. 32, 1403 (2003)
K.H. Prakash, T. Sritharan, Acta Mater. 49, 2481 (2001)
W.K. Choi, H.M. Lee, J. Electron. Mater. 29, 1207 (2000)
F. Guo, S. Choi, J.P. Lucas, K.N. Subramanian, J. Electron. Mater. 29, 1241 (2000)
D. Ma, W.D. Wang, S.K. Lahiri, J. Appl. Phys. 91, 3312 (2002)
C.R. Kao, Mater. Sci. Eng. A 238, 196 (1997)
S. Chada, R.A. Fournelle, W. Laub, D. Shangguan, J. Electron. Mater. 29, 1214 (2000)
Z. Mei, A.J. Sunwoo, J.W. Morris Jr, Metall. Trans. A 23, 857 (1992)
W.K. Choi, H.M. Lee, J. Electron. Mater 29, 1207 (2000)
H. Lee, M. Chen, H. Jao, T. Liao, Mater. Sci. Eng. A 358, 134 (2003)
Y.C. Chan, A.C.K. So, J.K.L. Lai, Mater. Sci. Eng. B 55, 5 (1998)
H.L.J. Pang, K.H. Tan, X.W. Shi, Z.P. Wang, Mater. Sci. Eng. A 307, 42 (2001)
H.W. Miao, J.G. Duh, Mater. Chem. Phys. 71, 255 (2001)
P. Protsenko, A. Terlain, V. Traskine, N. Eustathopoulos, Scripta Mater. 45, 1439 (2001)
D.R. Frear, JOM 48, 49 (1996)
R.E. Pratt, E.I. Stromswold, D.J. Quesnel, J. Electron. Mater. 23, 375 (1994)
C.K. Alex, Y.C. Chan, IEEE Trans. CPMT-B 19, 661 (1996)
P.L. Tu, Y.C. Chan, J.K.L. Lai, IEEE Trans. CPMT-B 20, 87 (1997)
X. Deng, R.S. Sidhu, P. Johnson, N. Chawla, Metall. Mater. Trans A 36, 55 (2005)
X. Deng, M. Koopman, N. Chawla, K.K. Chawla, Mater. Sci. Eng. 364, 241 (2004)
M.A. James, D. Swenson, FRANC2D/L: A Crack Propagation Simulator for Plane Layered Structures, available from http://www.mne.ksu.edu/~franc2d/.
V.V. Ganesh, N. Chawla, Mater. Sci. Eng. A 391, 342 (2005)
E.F. Rybicki, M.F. Kanninen, Eng. Frac. Mech. 9, 931 (1977)
F. Erdogan, G.C. Sih, J. Basic Eng. (1963) 519
A. Ayyar, N. Chawla, Comp. Sci. Tech. 66, 1980 (2006)
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2006 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Chawla, N., Sidhu, R.S. (2006). Microstructure-based modeling of deformation in Sn-rich (Pb-free) solder alloys. In: Lead-Free Electronic Solders. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-48433-4_11
Download citation
DOI: https://doi.org/10.1007/978-0-387-48433-4_11
Published:
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-48431-0
Online ISBN: 978-0-387-48433-4
eBook Packages: EngineeringEngineering (R0)