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Frey, M.D. (2006). Low kV Scanning Electron Microscopy. In: Zhou, W., Wang, Z.L. (eds) Scanning Microscopy for Nanotechnology. Springer, New York, NY. https://doi.org/10.1007/978-0-387-39620-0_4
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DOI: https://doi.org/10.1007/978-0-387-39620-0_4
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