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Microprocessor Architecture for Yield Enhancement and Reliable Operation

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Book cover High-Performance Energy-Efficient Microprocessor Design

Part of the book series: Series on Integrated Circuits and Systems ((ICIR))

Abstract

With the advance of semiconductor scaling, smaller devices become more vulnerable to an SEU (single event upset, i.e. neutron hit etc.) and operating margin of the circuits is reduced both due to reduced operating voltage and larger process variations. Robust circuit design alone cannot solve these problems. Micro-architectural techniques for avoiding defects and error detection and correction microarchitecure can significantly reduce the probability of failure and enhance the yield and the reliable operation of a microprocessor. The failure mechanisms of nanometer class semiconductor VLSI circuits are described as a background. Then concept and methods of error detection and correction are described, followed by microarchitecture/logic design error detection and recovery techniques. Commercial microprocessors using error detection and recovery techniques are also presented.

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Author information

Authors and Affiliations

  1. Fujitsu Ltd., 4-1-1 Kamikodanaka, Nakahara-ku, Kawasaki, Japan, 211-8588

    Hisashige Ando

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  1. Hisashige Ando
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Editor information

Editors and Affiliations

  1. Integration Corp., Berkeley

    Vojin G. Oklobdzija

  2. California and University of California, USA

    Vojin G. Oklobdzija

  3. Microprocessor Research Laboratory, Intel Corp., Hillsboro, Oregon

    Ram K. Krishnamurthy

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© 2006 Springer

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Ando, H. (2006). Microprocessor Architecture for Yield Enhancement and Reliable Operation. In: Oklobdzija, V.G., Krishnamurthy, R.K. (eds) High-Performance Energy-Efficient Microprocessor Design. Series on Integrated Circuits and Systems. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-34047-0_9

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  • DOI: https://doi.org/10.1007/978-0-387-34047-0_9

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-387-28594-8

  • Online ISBN: 978-0-387-34047-0

  • eBook Packages: EngineeringEngineering (R0)

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