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Electromagnetic Singularities and Resonances in Near-Field Optical Probes

  • Chapter
Scanning Probe Microscopy

Abstract

Over the last two decades scanning near-field optical microscopy (SNOM) has demonstrated its ability to provide optical resolution significantly better than the diffraction limit (<20 nm). The general principle of SNOM relies on the approach of a nanometer-sized object in the optical near-field of a sample to be studied. This nano-object (NO) is usually the extremity of a probe. Regardless of the nature of the observed SNOM signal (inelastic scattering, fluorescence, etc.), the detection of the light is achieved in the far-field regime where the NO acts as a mediator between the optical near-field and the detector. Figure 1 is a schematic illustration of the SNOM principle.

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Authors and Affiliations

  1. UMR 5027 Faculté des Sciences Mirande, Laboratoire de Physique de l’Université de Bourgogne, 9 Avenue Alain Savary, B.P. 47 870, F-21078, Dijon Cedex, France

    Dr. Alexandre Bouhelier

  2. Laboratoire de Nanotechnologie et d’Instrumentation Optique Institut Charles Delaunay CNRS-FRE 2848, Université de Technologie de Troyes, F-10010, Troyes, France

    Prof. Renaud Bachelot

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  1. Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA

    Sergei Kalinin

  2. Dept. Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, USA

    Alexei Gruverman

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Bouhelier, A., Bachelot, R. (2007). Electromagnetic Singularities and Resonances in Near-Field Optical Probes. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-28668-6_9

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