Abstract
Near-field microwave microscopy is concerned with quantitative measurement of the microwave electrodynamic response of materials on length scales far shorter than the free-space wavelength of the radiation. Here we review the basic concepts of near-field interactions between a source and sample, present an historical introduction to work in the field, and discuss a novel quantitative modeling approach to interpreting near-field microwave images. We discuss the spatial resolution and a number of concrete applications of near-field microwave microscopy to materials property measurements, as well as future prospects for new types of microscopy.
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Anlage, S.M., Talanov, V.V., Schwartz, A.R. (2007). Principles of Near-Field Microwave Microscopy. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-28668-6_8
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