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Principles of Kelvin Probe Force Microscopy

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Book cover Scanning Probe Microscopy

Abstract

In this chapter we describe and discuss Kelvin probe force microscopy (KPFM), a scanning probe microscopy technique designed to obtain laterally resolved work function images by measuring the electrostatic forces between probe and sample surface. By operating the microscope in ultrahigh vacuum, even absolute work function measurements with very high lateral and energy resolution can be realized.

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Author information

Authors and Affiliations

  1. Institute of Physics, University of Basel, Klingelbergstr. 82, CH-4056, Basel

    Dr. Th. Glatzel

  2. Department of Heterogeneous Material Systems (SE2), Hahn-Meitner-Institut Berlin, Glienicker Str. 100, D-14109, Berlin

    Prof. Dr. M.Ch. Lux-Steiner

  3. Faculty of Engineering, Tel-Aviv University, Elec. Lab. Building, room 231, Tel-Aviv, 69978, Israel

    E. Strassburg, A. Boag & Prof. Y. Rosenwaks

Authors
  1. Dr. Th. Glatzel
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  2. Prof. Dr. M.Ch. Lux-Steiner
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  3. E. Strassburg
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  4. A. Boag
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  5. Prof. Y. Rosenwaks
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Editor information

Editors and Affiliations

  1. Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA

    Sergei Kalinin

  2. Dept. Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, USA

    Alexei Gruverman

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Glatzel, T., Lux-Steiner, M., Strassburg, E., Boag, A., Rosenwaks, Y. (2007). Principles of Kelvin Probe Force Microscopy. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-28668-6_5

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