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Resistive Probe Storage: Read/Write Mechanism

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Book cover Scanning Probe Microscopy

Abstract

We define probe storage in a broad sense, which includes most of the mechanically addressing storage devices such as hard disk drives and optical disk drives. Its history is briefly discussed from the era of inscription, which leads to the application of scanning probe microscopy (SPM), to probe storage devices. Most of the current activities regarding the SPM based probe storage device are reviewed with special emphasis on resistive probe storage and related methods that use ferroelectric materials as information media. We present the principle of the read/write mechanism using the resistive probe accompanied by a servo/tracking concept. Such resistive probes can be implemented into probe storage devices with ferroelectric media development, which shows promise for the terabit era.

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Author information

Authors and Affiliations

  1. Semiconductor Device and Material Lab, Samsung Advanced Institute of Technology, P.O. Box 111, Suwon, 440-600, Korea

    Dr. Seungbum Hong

  2. Storage System Division, Semiconductor Business Samsung Electronics, Suwon, Korea

    Mr. Noyeol Park (Vice President)

Authors
  1. Dr. Seungbum Hong
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  2. Mr. Noyeol Park
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Editor information

Editors and Affiliations

  1. Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA

    Sergei Kalinin

  2. Dept. Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, USA

    Alexei Gruverman

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Hong, S., Park, N. (2007). Resistive Probe Storage: Read/Write Mechanism. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-28668-6_36

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