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High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices

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Book cover Scanning Probe Microscopy

Abstract

Conducting and semiconducting organic materials have long been known [1], [2], but recent advances in chemical synthesis [3], [4] have enabled organic materials to begin delivering on the promise of mass-produced economical electronic devices. Organic electronic materials are better suited for constructing high-efficiency light-emitting diodes [5]–[8], solar cells [9], [10], and cheap solution-processable thin-film transistors [6], [11]–[18] than are crystalline inorganic semiconductors such as silicon and gallium arsenide. The electronic/optical properties and solubility of organic materials can be tuned independently by chemical synthesis [4]. Since they can be processed and patterned at ambient temperature, organic electronic materials are compatible with flexible large-area substrates [19].

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Authors and Affiliations

  1. Dept. of Chemistry and Chemical Biology 150 Baker Laboratory, Cornell University, Ithaca, NY, 14853-1301

    William R. Silveira, Erik M. Muller, Tse Nga Ng & Prof. John A. Marohn

  2. Dept. of Physics and Astronomy, Univ. of New Mexico, Albuquerque, NM, 87131

    Prof. David Dunlap

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  1. William R. Silveira
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  2. Erik M. Muller
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  3. Tse Nga Ng
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  4. Prof. David Dunlap
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  5. Prof. John A. Marohn
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Editors and Affiliations

  1. Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA

    Sergei Kalinin

  2. Dept. Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, USA

    Alexei Gruverman

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Silveira, W.R., Muller, E.M., Ng, T.N., Dunlap, D., Marohn, J.A. (2007). High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-28668-6_30

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