Silicon On Insulator (SOI) structures do not vary much from normal bulk CMOS. The major difference is the insertion of the insulation layer beneath the devices. Once this is accomplished, one could continue to use the identical bulk CMOS process and fabricate the devices. No changes to the process would be required. This chapter will discuss the physical structures and fabrication techniques of the wafer, FETs, diodes, resistors and thin oxide capacitors. Intertwined with the physical descriptions will be the mention of process changes to enhance the SOI device’s usability and performance.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Rights and permissions
Copyright information
© 2007 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
(2007). SOI Device Structures. In: SOI Circuit Design Concepts. Springer, Boston, MA. https://doi.org/10.1007/978-0-306-47013-4_2
Download citation
DOI: https://doi.org/10.1007/978-0-306-47013-4_2
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-74099-7
Online ISBN: 978-0-306-47013-4
eBook Packages: Springer Book Archive