Abstract
The main thesis of this paper is that reasoning about measurements can be used as a basic mechanism for generating test plans for analogical circuits. Motivated by an application scenario, reasoning about measurements incorporates domain knowledge about testing conditions, local behavior of circuit components (fault modes covered by measurements) and the topological structure of the circuit to be tested. With the test generation architecture introduced in this paper, a combinatorial explosion which is problematic in model-based test generation approaches can be avoided.
Work in this project has been done in collaboration with “DTK: Gesellschaft für Technische Kommunikation mbH”, Hamburg. We would like to thank U. Haferstroh, A. Josub, M. Orligk and M. Schmidt. Many thanks also to our students A. Kaplunova and H. Paulsen who not only implemented large parts of the interface and the test generator but also contributed many good ideas for the PETS architecture. The project was supported by the Wirtschaftsbehörde of Hamburg.
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Lange, H., Möller, R., Neumann, B. (1996). Avoiding combinatorial explosion in automatic test generation: Reasoning about measurements is the key. In: Görz, G., Hölldobler, S. (eds) KI-96: Advances in Artificial Intelligence. KI 1996. Lecture Notes in Computer Science, vol 1137. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-61708-6_62
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DOI: https://doi.org/10.1007/3-540-61708-6_62
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