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Searching for faulty leaves in binary trees

  • Peter Damaschke
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 1017)

Abstract

Let us be given a complete binary tree where an unknown subset of the leaves is faulty. Suppose that we can test any node whether there is a faulty leaf in the subtree routed at that node. Our aim is to give a strategy for finding all faults that minimizes the worst-case search length for a previously estimated number of faults. This question is of immediate interest in VLSI circuit checking. In this paper we give an elementary proof of the optimality of a very simple test strategy.

Keywords

Search Process Binary Tree Complete Binary Tree Maximal Antichain Faulty Cell 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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Copyright information

© Springer-Verlag Berlin Heidelberg 1995

Authors and Affiliations

  • Peter Damaschke
    • 1
  1. 1.Theoretische Informatik IIFernUniversitÄtHagenGermany

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