Abstract
We realize an experimental analysis of the dielectric breakdown by means of a lattice of resistors and light emitting diodes (LED). The LEDs mimic the behavior of an insulator which cannot stand a voltage higher than a threshold and is transformed in a conductor. We show that the breakdown voltage behaves as the minimum insulation gap. We determined the pattern of the breakdown path made by all the broken insulators, at the breakdown voltage.
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© 1994 Springer-Verlag
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Benguigui, L., Ron, P. (1994). Laboratory simulation of dielectric breakdown. In: Bardhan, K.K., Chakrabarti, B.K., Hansen, A. (eds) Non-Linearity and Breakdown in Soft Condensed Matter. Lecture Notes in Physics, vol 437. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-58652-0_39
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DOI: https://doi.org/10.1007/3-540-58652-0_39
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Online ISBN: 978-3-540-49037-1
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