# Some remarks on the test complexity of iterative logic arrays

## Abstract

The problem of detecting single cellular faults in arbitrarily large (one-dimensional, unilateral, combinational) iterative logic arrays (= ILAs) is considered. We prove that the *test complexity* of such an ILA is either constant or linear in the length of the ILA. The determination of the test complexity and the specification of the test set can be carried out by algorithms whose complexity only depends on the individual cell function of the ILA. *Fault patterns* which characterize any cellular fault are denned and their testability properties like (full, partial) testability, redundancy, test complexity are studied to give insight into the testability properties of the ILA under test construction.

## Keywords

Testability Property Very Large Scale Integration Fault Pattern Input Combination Test Complexity## Preview

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