Some remarks on the test complexity of iterative logic arrays

Extended abstract
  • Bernd Becker
  • Joachim Hartmann
Part of the Lecture Notes in Computer Science book series (LNCS, volume 629)


The problem of detecting single cellular faults in arbitrarily large (one-dimensional, unilateral, combinational) iterative logic arrays (= ILAs) is considered. We prove that the test complexity of such an ILA is either constant or linear in the length of the ILA. The determination of the test complexity and the specification of the test set can be carried out by algorithms whose complexity only depends on the individual cell function of the ILA. Fault patterns which characterize any cellular fault are denned and their testability properties like (full, partial) testability, redundancy, test complexity are studied to give insight into the testability properties of the ILA under test construction.


Testability Property Very Large Scale Integration Fault Pattern Input Combination Test Complexity 
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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • Bernd Becker
    • 1
  • Joachim Hartmann
    • 2
  1. 1.Computer Science DepartmentJ.W.G.-UniversityFrankfurtGermany
  2. 2.Computer Science DepartmentUniversity of SaarlandSaarbrückenGermany

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