Abstract
Although incorporating significant performance detail, the generation of large trace files poses problems for performance interpretation. The potential need to compare multiple traces, possibly produced by different means (e.g., measured execution or simulation), exacerbates the difficulties in building general trace analysis and display solutions. This paper describes a trace visualization tool, TraceView, that provides a convenient, general purpose environment for trace manipulation and display. TraceView manages trace visualization sessions that the user constructs, handling functions such as trace file I/O, view specification, and display selection. TraceView can be applied in several trace contexts. Examples are given using traces generated from measured application execution on a Cray X-MP and simulated application execution to determine maximum parallelism. The TraceView tool can be extended, particularly in the addition of new display methods.
An extended version of this paper will appear in IEEE Software, September, 1991.
Supported in part by the National Science Foundation under Grants No. NSF MIP-88-07775 and No. NSF ASC 84-04556, and the NASA Ames Research Center Grant No. NCC-2-559. Work done while at Center for Supercomputing Research and Development, University of Illinois Urbana, Illinois 61801
Supported in part by the U. S. Air Force Office of Scientific Research under grant No. AFSOR 90-0044 and by the U.S. Department of Energy under grant No. DE-FG02-85ER25001.
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© 1992 Springer-Verlag Berlin Heidelberg
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Malony, A.D., Hammerslag, D.H., Jablonowski, D.J. (1992). Traceview: A trace visualization tool. In: Zima, H.P. (eds) Parallel Computation. ACPC 1991. Lecture Notes in Computer Science, vol 591. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-55437-8_74
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DOI: https://doi.org/10.1007/3-540-55437-8_74
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