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Modelling the False Alarm and Missed Detection Rate for Electronic Watermarks

  • Jean -Paul Linnartz
  • Ton Kalker
  • Geert Depovere
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 1525)

Abstract

Theoretical modeling of watermarks allow prediction of the detector reliability and facilitates the development of more reliable systems. In particular, mathematical evaluation is relevant to estimate the rate at which “false alarms” occur. In this paper, the probability of incorrect detection (missed detection or false alarm) is expressed in terms of the watermark-energy-to-image-luminance-variance ratio. We present some counterintuitive results which show for instance that the reliability of detection significantly depends on spatial correlation in watermark. Moreover we find that a small but uncompensated random DC component in the watermark can have a significant effect on the reliability.

Keywords

False Alarm Decision Variable Spatial Correlation Linear Feedback Shift Register Watermark Detector 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    I. Pitas, T. Kaskalis: “Signature Casting on Digital Images”, Proceedings IEEE Workshop on Nonlinear Signal and Image Processing, Neos Marmaras, June 1995Google Scholar
  2. 2.
    W. Bender, D. Gruhl, N. Morimoto and A. Lu, “Techniques for data hiding”, IBM Systems Journal, Vol. 35. No. 3/4 1996Google Scholar
  3. 3.
    J.R. Smith, B. O. Comiskey, “Modulation and Information Hiding in Images”, in Proc. Workshop on Information Hiding, Univ. of Cambridge, U.K., May 30–June 1, 1996, pp. 191–201Google Scholar
  4. 4.
    I. Cox, J. Kilian, T. Leighton and T. Shamoon, “A secure, robust watermark for multimedia”, in Proc. Workshop on Information Hiding, Univ. of Cambridge, U.K., May 30–June 1, 1996, pp. 175–190Google Scholar
  5. 5.
    I.J. Cox and J.P.M.G. Linnartz, “Public Watermarks and resistance to tampering”, Presented at ICIP 97, Santa Barbara, CA, October 1997.Google Scholar
  6. 6.
    J.P.M.G. Linnartz, A.C.C. Kalker, G.F.G. Depovere and R. Beuker, “A reliability model for detection of electronic watermarks in digital images”, Benelux Symposium on Communication Theory, Enschede, October 1997, pp. 202–208Google Scholar
  7. 7.
    Ton Kalker, “Watermark Estimation Through Detector Observations”, in Proc. of the IEEE Benelux Signal Processing Symposium, 1998, Leuven, Belgium, pp. 119–122.Google Scholar
  8. 8.
    Ton Kalker, Jean-Paul Linnartz and Geert Depovere, “On the Reliability of detecting Electronic Watermarks in Digital Images”, acc. at Eusipco’ 98Google Scholar
  9. 9.
    I. J. Cox, M. L. Miller, “A review of watermarking and the importance of perceptual modeling”, Proc. of Electronic Imaging 97, Feb. 1997.Google Scholar
  10. 10.
    N.S. Jayant and P. Noll., “Digital Coding of waveforms” Prentice Hall, 1984.Google Scholar
  11. 11.
    Ch. W. Therrien, “Discrete Random Signals and Statistical Signal Processing” Prentice Hall, 1992.Google Scholar
  12. 12.
    “Wireless Communication, The InteractiveMultiMedia CD ROM”, Baltzer Science Publishers, Amsterdam, 2nd Edition, 1997, http://www.baltzer.nl/wirelesscd
  13. 13.
    F.J. McWilliams and N.J.A. Sloane, “Pseudo-Random Sequences and arrays”, Proc. of IEEE, Vol. 64, No. 12, Dec. 1976, pp. 1715–1729CrossRefMathSciNetGoogle Scholar
  14. 14.
    D. Lin and M. Liu, “Structure and Properies of Linear Recurring m-arrays”, IEEE Tr. on Inf. Th., Vol. IT-39, No. 5, Sep. 1993, pp. 1758–1762zbMATHGoogle Scholar
  15. 15.
    G.R. Grimmet and D.R. Stirzaker, “Probability and Random Processes”, chapter on convergence of random variables, Oxford Science Publishers, 2nd Edition, 1992.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1998

Authors and Affiliations

  • Jean -Paul Linnartz
    • 1
  • Ton Kalker
    • 1
  • Geert Depovere
    • 1
  1. 1.Philips Research LaboratoriesEindhovenThe Netherlands

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