Abstract
Surfaces are becoming more important especially as miniaturization progresses and with the advent of micro mechanics. The role of the surface is explored with respect to control of manufacture and prediction of performances at interfaces and rubbing bodies. This is developed to include some aspects of designer surfaces. Instruments for measuring surfaces are critically examined. These include the well-known stylus method, optical methods and the new generation of scanning probe methods: Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM). Finally, the ways in which surfaces are characterized from profile traces and over an area are described.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
General Bibliography
Surface Metrology
D. J. Whitehouse: Handbook of Surface Metrology, Inst. of Physics, Bristol (1994)
Optical Surface Metrology
F. G. Bass, I. M.Fuchs: Wave Scattering of Electromagnetic Waves from Rough Surfaces, Macmillan, New York (1961)
P. Beckmann, A. Spizzichino: The Scattering of Electomagnetic Waves from Rough Surfaces, Pergamon, Oxford (1963)
J. M. Bennet: Surface Finish and its Measurement, Collected Works in Optics Vols. 1,2, Opt. Soc. America, Washington, DC (1992)
J. A. Ogilvy: The Theory of Wave Scattering from Random Surface, Pergamon, Oxford (1991)
D. J. Whitehouse: Optical Methods in Surface Metrology, SPIE Milestone Ser. 129, (1996)
References
J. F. Archard: Proc. R. Soc. Lond. A 243, 190 (1957)
A. E. Norton: Lubrication, McGraw Hill, New York (1942)
J. T. Burwell: Wear 1, 119 (1957)
J. Perthen: Prüfen und Messen der Oberflächengestalt, Hasser, Munich (1949)
D. J. Whitehouse: Proc. Inst. Mech. Eng. 192, 179 (1978)
D. J. Whitehouse: J. Inst. Phys. Meas. Sci. Technol. 8, 955 (1997)
D. J. Whitehouse: Proc. Wear Conf. MIT, (1978) p. 17
Y. G. Schneider: Prec. Eng. 6, 219 (1984)
R. E. Reason, M. R. Hopkins, R. I. Garrod: Report on the Measurement of Surface Finish by Stylus Methods, Rank, Leicester (1944)
R. E. Reason: The Measurement of Surface Texture, in Wright-Baker (Ed.): Modern Workshop Technology, 2nd edn., Macmillan, London (1970)
D. J. Whitehouse: J. Phys. E. 15, 1337 (1982)
J. Prescott: Applied Elasticity, Longmans, London (1961)
G. Schmalz: Z. VDI, 73, 144 (1929)
D. J. Whitehouse: Proc Inst. Mech. Eng. 202, 169 (1988)
D. J. Whitehouse: Optical Methods in Surface Metrology, SPIE Milestone Ser. 129 (1996)
A. Guild: J. Sci. Inst. 5, 209 (1940)
J. H. Rakels: J. Phys. E. 19, 76 (1986)
U. Breitmeier: Optical Follower Optimized, UBM Tech. Note (1990)
S. Tolansky: Verh. Tag. Dtsch. Phys. Ges. 5–7, Göttingen (1947)
J. C. Wyant: Appl. Opt. 11, 2622 (1975)
J. Z. Young, T. Roberts: Nature 167, 231 (1951)
C. J. R. Sheppard, T. Wilson: Opt. Lett. 3, 115 (1978)
M. Dupuy: Proc. Inst. Mech. Eng. 180, 200 (1968)
G. E. Sommarren: Appl. Opt. 20, 610 (1981)
E. L. Church, H. A. Jenkinson, J. M. Zavada: Opt. Eng. 16, 360 (1977)
E. L. Church, T. V. Vorburger, J. M. Zavada: SPIE Proc. 508, 13 (1985)
R. W. Sprague: Pt. Opt. 11, 2811 (1972)
G. Graneck, H. L. Wunsch: Machinery 81, 707 (1952)
K. F. Sherwood, P. M. Cross: Proc. Inst. Mech. Eng. 182 (1968)
J. W. S. Hearle, J. T. Sparrow, P. M. Cross: Scanning Electron Microscope, Pergamon, Oxford (1972)
H. K. Wickramasinghe: AIP Proc. 241 (1991)
D. J. Whitehouse, R. E. Reason: The Equation of the Mean Line of Surface Texture, Rank, Leicester (1965)
D. J. Whitehouse: Proc. Inst. Mech. Eng. 182, 179 (1968)
ISO Standard, No. 3274, Geneva (1996)
A. Van der Lugt: Opt. Acta 15, 1 (1968)
ISO Standards Handbook, Applied Metrology, Limits fits & Surface Properties, ISO, Geneva (1988)
BS. ISO, No. 13565, parts 1 & 2 (1996)
D. J. Whitehouse, M. J. Phillips: Philos. Trans. R. Soc. Lond. A 290, 267 (1978)
M.S Longuet-Higgins: Proc. Roy. Soc. Lond. A 249, 321 (1957)
J. Peklenik: Proc. Inst. Mech. Eng. 182, 108 (1968)
D. J. Whitehouse: Annals CIRP 27, 491 (1978)
J. A. Greenwood: Proc. Roy. Soc. Lond. A 295, 300 (1966)
J. A. Greenwood: Proc. Roy. Soc. Lond. A 393, 133 (1984)
D. J. Whitehouse, J. F. Archard: ASME Conf. Surface Mechanics, Los Angeles, CA (1969) p. 36
B. F. Gaus: Trans. ASME, J. Tribol. 109, 427 (1987)
K. J. Stout, P. J. Sullivan, W. P. Dong, E. Minsah, K. Subari, and T. Mathia: European Community Document, No. 33, 74/1/0/170/90/2
D. J. Whitehouse, M. J. Phillips: Philos. Trans. R. Soc. A 305, 441 (1982)
M. Pesante: Annals CIRP 12, 61 (1963)
M. Ehrenreich: Microtecnik XII, 103 (1959)
N. Myres: Wear 5, 182 (1962)
J. Peklenik, M. Kubo: Annals CIRP 16, 235 (1968)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2000 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Whitehouse, D.J. (2000). Surface Characterization and Roughness Measurement in Engineering. In: Rastogi, P.K. (eds) Photomechanics. Topics in Applied Physics, vol 77. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-48800-6_12
Download citation
DOI: https://doi.org/10.1007/3-540-48800-6_12
Published:
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-65990-7
Online ISBN: 978-3-540-48800-2
eBook Packages: Springer Book Archive