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Surface Characterization and Roughness Measurement in Engineering

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Book cover Photomechanics

Part of the book series: Topics in Applied Physics ((TAP,volume 77))

Abstract

Surfaces are becoming more important especially as miniaturization progresses and with the advent of micro mechanics. The role of the surface is explored with respect to control of manufacture and prediction of performances at interfaces and rubbing bodies. This is developed to include some aspects of designer surfaces. Instruments for measuring surfaces are critically examined. These include the well-known stylus method, optical methods and the new generation of scanning probe methods: Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM). Finally, the ways in which surfaces are characterized from profile traces and over an area are described.

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Author information

Authors and Affiliations

  1. University of Warwick, UK

    David J. Whitehouse

  2. Metrology Consultant, Taylor Hobson Ltd., UK

    David J. Whitehouse

Authors
  1. David J. Whitehouse
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Editor information

Editors and Affiliations

  1. Stress Analysis Laboratory IMAC-DGC, Swiss Federal Institute of Technology, 1015, Lausanne, Switzerland

    Pramod K. Rastogi

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© 2000 Springer-Verlag Berlin Heidelberg

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Whitehouse, D.J. (2000). Surface Characterization and Roughness Measurement in Engineering. In: Rastogi, P.K. (eds) Photomechanics. Topics in Applied Physics, vol 77. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-48800-6_12

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  • DOI: https://doi.org/10.1007/3-540-48800-6_12

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-65990-7

  • Online ISBN: 978-3-540-48800-2

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