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Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms

  • V. N. Yarmolik
  • I. V. Bykov
  • S. Hellebrand
  • H.-J. Wunderlich
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 1667)

Abstract

The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric versions. This approach allows to skip the signature prediction phase inherent to conventional transparent memory testing and therefore to significantly reduce test time. The hardware overhead and fault coverage of the new BIST scheme are comparable to the conventional transparent BIST structures. Experimental results show that in many cases the proposed test techniques achieve a higher fault coverage in shorter test time.

Keywords

Fault Coverage Proceeding IEEE Hardware Overhead March Test Reduce Test Time 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1999

Authors and Affiliations

  • V. N. Yarmolik
    • 1
    • 2
  • I. V. Bykov
    • 1
  • S. Hellebrand
    • 3
  • H.-J. Wunderlich
    • 3
  1. 1.Computer Systems DepartmentBelarussian State University of Informatics and RadioelectronicsMinskBelarus
  2. 2.Department of Computer ScienceBialystok University of TechnologyPoland
  3. 3.Division of Computer ArchitectureUniversity of StuttgartStuttgartGermany

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