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Structural Characterization of Crystalline and Non-crystalline Materials — A Brief Background of Current Requirements

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Anomalous X-Ray Scattering for Material Characterization

Part of the book series: Springer Tracts in Modern Physics ((STMP,volume 179))

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Abstract

The X-ray powder diffraction technique is a well-established and widely used method for both qualitative and quantitative analysis of various substances in a variety of states (see, for example, [1]). However, in a multi-component mixture with a relatively complicated chemical composition, we frequently find difficulty in identifying the individual chemical constituents by the conventional X-ray powder diffraction method. There are also generally insufficient differences in the X-ray diffraction intensities for two elements of nearly the same atomic number in the periodic table. For example, this is certainly the case for a mixture of copper sulfide and ferrite components in the products of a copper smelting process.

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(2002). Structural Characterization of Crystalline and Non-crystalline Materials — A Brief Background of Current Requirements. In: Anomalous X-Ray Scattering for Material Characterization. Springer Tracts in Modern Physics, vol 179. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-46008-X_1

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  • DOI: https://doi.org/10.1007/3-540-46008-X_1

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  • Print ISBN: 978-3-540-43443-6

  • Online ISBN: 978-3-540-46008-4

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