Abstract
Scanning near-field optical microscopy (SNOM) is a method to obtain information about the optical properties of a sample at a lateral resolution below the diffraction limit of far-field microscopy. In SNOM, a light source of a dimension which is small compared to the wavelength of light and which is held at a small distance from the sample is scanned across the surface of the sample. The modulation by the sample of the light emitted from the source is recorded as a signal. As a general rule one may say that the size of the source and the distance to the sample limit the resolution of SNOM. A radiating self-emitting point dipole may be regarded as an idealized SNOM source. With such a source the resolution of SNOM imaging is expected to be limited by the distance of this dipole to the surface of the object [1]. It is difficult to design a light-emitting SNOM probe corresponding to a dipole at a distance of less than 10 nm from the object and it is therefore difficult to conceive SNOM imaging beyond a resolution of 10 nm. There have been, however, occasional reports of near-field optical imaging at a resolution in the range of 1-10 nm [2, 3]. In SNOM-images recorded with the tetrahedral tip (T-tip) a resolution in the range of 1-10 nm was obtained reproducibly on samples consisting of small grains of silver of a size of the order of 2-10 nm embedded in a flat surface of gold [3, 4]. An example of an image is shown in Fig. 1. In a different experiment we investigated a surface-embedded latex bead projection pattern [5] consisting of a flat surface of a polymer into which gold patches of a triangular shape of a size of about 50 nm and a thickness of 20 nm were embedded [6].
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References
J. M. Vigoureux, F. Depasse, G. Girard: Super-Resolution of near-field optical microscopy defined from the properties of confined electromagnetic waves, Appl. Opt. 31, 3036–3045 (1992)
F. Zenhausern, Y. Marti, H. K. Wickramasinghe: Scanning interferometric apertureless microscopy, Optical imaging at 10 angstrom resolution. Science 269, 1083–1085 (1995)
J. Koglin, U. C. Fischer, H. Fuchs: Material contrast in scanning near-field optical microscopy at 10-1 nm resolution. Phys. Rev. B 55, 7977 (1997)
J. Heimel, U. C. Fischer, H. Fuchs: SNOM/STM using a tetrahedral tip and a sensitive current to voltage converter. J. Microsc. 202, 53–59 (2001)
U. C. Fischer, J. Heimel, H. J. Maas, M. Hartig, S. Hoeppener, H. Fuchs: Latex bead projection nano-patterns, Surf. Interface Anal. 33, 75–80 (2002)
H. J. Maas, A. Naber, H. Fuchs, U. C. Fischer, J. C. Weeber, A. Dereux: Imaging of photonic nanopatterns by scanning near-field optical microscopy. J. Opt. Soc. Am. B 19, 1295–1300 (2002)
C. Girard, A. Dereux: Near-field optics theories. Rep. Prog. Phys. 59, 657–659 (1996)
U. C. Fischer, A. Dereux, J. C. Weeber: Controlling the light confinement by localized surface plasmon excitation, in Near-Field Optics and Surface Plasmon Polaritons, S. Kawata (Ed.), Topics Appl. Phys. 81 (Springer, Berlin, Heidelberg 2001) pp. 49–68
K.L. Chopra: Thin Film Phenomena (McGraw Hill, New York 1969)
P. K. Aravind, H. Metiu: The effects of the interaction between resonances in the electromagnetic response of a sphere-plane structure: applications to surface enhanced spectroscopy, Surf. Sci. 124, 506–528 (1983)
J. R. Krenn, A. Dereux, J. C. Weeber, E. Bourillot, Y. Lacroute, J.P. Goudonnet, G. Schider, W. Gotschy, A. Leitner, F. R. Aussenegg, C. Girard: Squeezing the optical near-field zone by plasmon coupling of metallic nanoparticles, Phys. Rev. Lett. 82, 2590–2593 (1999)
J. B. Pendry: Negative refraction index makes a perfect lens. Phys. Rev. Lett. 85, 3966–3969 (2000)
J. Wessel: Surface enhanced optical microscopy. J. Opt. Soc. Am. B 2, 1538–1541 (1985)
U. C. Fischer: Submicrometer aperture in a thin metal film as a probe of its microenvironment through enhanced light scattering and fluorescence. J. Opt. Soc. Am. B 3, 1239–1244 (1986)
U. C. Fischer, D.W. Pohl: Observation of single-particle plasmons by near field microscopy. Phys. Rev. Lett. 62, 458–461 (1989)
U. C. Fischer, J. Heimel: Elastic scattering by a metal sphere with an adsorbed molecule as a model for the detection of single molecules by scanning probe enhanced elastic resonant scattering (SPEERS). Jpn. J. Appl. Phys. 40, 4391–4394 (2001)
I. S. Averbukh, B. M. Chernobrod, O. A. Sedletsky, Y. Prior: Coherent near-field optical microscopy, Opt. Commun. 174, 33–41 (2000)
B. Pettinger, G. Picardi, R. Schuster, G. Ertl: Surface-enhanced raman spectroscopy: towards single molecule spectroscopy. Electrochem. (Japan) 68, 942–949 (2000)
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Fischer, U.C., Heimel, J., Maas, HJ., Fuchs, H., Weeber, J.C., Dereux, A. (2003). Super-Resolution Scanning Near-Field Optical Microscopy. In: Tominaga, J., Tsai, D.P. (eds) Optical Nanotechnologies. Topics in Applied Physics, vol 88. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45871-9_10
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DOI: https://doi.org/10.1007/3-540-45871-9_10
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