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Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy

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Nanoscale Spectroscopy and Its Applications to Semiconductor Research

Part of the book series: Lecture Notes in Physics ((LNP,volume 588))

Abstract

The methodology for the determination of a nanosized particle distribution by low frequency Raman spectroscopy is described. It is based on a ν -1 dependence of the Raman light of the vibration coupling coefficient C(ν) and on the fact that each nanocrystalite of diameter D vibrates with its eigenfrequency í α 1/D. The effect of the particle vibrational lifetime on the shape of the distribution is analyzed and found to be negligible for free TiO2 nanoparticles. The size distributions of TiO2 nanoparticles estimated by Raman spectroscopy were compared to those obtained by transmission electron microscopy including dark field and high resolution imaging. The Raman spectroscopy was shown to be a simple, fast method that has favourable statistics due to a macroscopic probe volume and makes in situ measurements possible.

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Author information

Authors and Affiliations

  1. Rudjer Bošković Institute, P.O.Box 180, 10002, Zagreb, Croatia

    M. Ivanda, M. Gotić & S. Musić

  2. Faculty of Sciences, Department of Physics, University of Zagreb, P.O.Box 331, 10002, Zagreb, Croatia

    A. M. Tonejc & I. Djerdj

  3. Instituto Nazionale per la Fisica della Materia, Dipartimento di Fisica, Università di Trento, I-38050 Povo, Trento, Italy

    M. Ivanda, G. Mariotto & M. Montagna

Authors
  1. M. Ivanda
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  2. A. M. Tonejc
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  3. I. Djerdj
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  4. M. Gotić
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  5. S. Musić
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  6. G. Mariotto
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  7. M. Montagna
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Editor information

Editors and Affiliations

  1. NTT Basic Research Laboratories, 3-1,Morinosato Wakamiya, 243-0198, Atsugi-shi Kanagawa, Japan

    Yoshio Watanabe

  2. Istituto MASPEC, Parco Area delle Science 37/A, 43010, Parma, Italy

    Giancarlo Salviati

  3. Sincrotrone Trieste, AREA Science Park Strada Statale 14, Km 163,5, 34012, Trieste, Basovizza, Italy

    Stefan Heun

  4. Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, 152-8551, Tokyo, Japan

    Naoki Yamamoto

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© 2002 Springer-Verlag Berlin Heidelberg

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Ivanda, M. et al. (2002). Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy. In: Watanabe, Y., Salviati, G., Heun, S., Yamamoto, N. (eds) Nanoscale Spectroscopy and Its Applications to Semiconductor Research. Lecture Notes in Physics, vol 588. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45850-6_3

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  • DOI: https://doi.org/10.1007/3-540-45850-6_3

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-43312-5

  • Online ISBN: 978-3-540-45850-0

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