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Growth and Characterization of Ge Nanostructures on Si(111)

  • F. Rosei
  • N. Motta
  • A. Sgarlata
  • A. Balzarotti
Conference paper
Part of the Lecture Notes in Physics book series (LNP, volume 588)

Abstract

The study of growth and evolution of Ge/Si(111) islands by STM and AFM is presented and discussed. The coexistence of strained and relaxed islands in agreement with theoretical equilibrium calculations is reported. The formation of a trench around ripened island due to selective depletion of the wetting layer is observed for the first time in the case of Ge/Si(111) islands. The presence of misfit dislocations at the edges of the ripened islands is associated to the promotion of an atomic current from higher strain island regions. The Ge atoms move from the top of the island centre to the base thereby leading to a rounding of the island shape and to a decrease of the aspect ratio.

Keywords

Selective Depletion Island Shape Atomic Current Island Height Local Strain Energy Density 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2002

Authors and Affiliations

  • F. Rosei
    • 1
    • 2
  • N. Motta
    • 1
  • A. Sgarlata
    • 1
  • A. Balzarotti
    • 1
  1. 1.Dipartimento di Fisica and Unità INFMUniversità di Roma Tor VergataRomaItaly
  2. 2.Institute of Physics and Astronomy and Center for Atomic Scale Materials PhysicsUniversity of AarhusC AarhusDenmark

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